Creating a stable oxide at the surface of black phosphorus

ACS Applied Materials and Interfaces

Volumn 7, Issue 27, 2015, Pages 14557-14562

  Edmonds, M T ^a   Tadich, A ^b   Carvalho, A ^c,d   Ziletti, A ^e   O'Donnell, K M ^f   Koenig, S P ^c,d   Coker, D F ^e   Ozyilmaz B ^c,d   Neto, A H Castro ^c,d,e   Fuhrer, M S ^a,g  

^a MONASH UNIVERSITY   (Australia)

^b AUSTRALIAN SYNCHROTRON   (Australia)

^c National University of Singapore   (Singapore)

^d NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^e Boston University   (United States)

^f CURTIN UNIVERSITY   (Australia)

^g UNIVERSITY OF MARYLAND   (United States)

Author keywords

air stability; black phosphorus; oxidation; XPS

Indexed keywords

CHARGE TRANSFER; OXIDATION; PHOTOELECTRON SPECTROSCOPY; X RAY PHOTOELECTRON SPECTROSCOPY;

AIR STABILITY; ATMOSPHERE EXPOSURE; DIELECTRIC DEPOSITION; INTERFACE LAYER; LEVELS SHIFTING; OXIDE LAYER; SUB NANOMETERS; THICK OXIDES;

PHOSPHORUS;

EID: 84937133325     PISSN: 19448244     EISSN: 19448252     Source Type: Journal    
DOI: 10.1021/acsami.5b01297     Document Type: Article

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