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Volumn 15, Issue 7, 2015, Pages 4647-4663

Dynamic Charge Carrier Trapping in Quantum Dot Field Effect Transistors

Author keywords

bias stress; charge transport; Colloidal quantum dot; dynamic charge trapping; field effect transistor; hysteresis

Indexed keywords

AMORPHOUS SEMICONDUCTORS; CARRIER CONCENTRATION; CHARGE TRANSFER; DYNAMICS; HYSTERESIS; QUANTUM CHEMISTRY; SEMICONDUCTOR MATERIALS; SEMICONDUCTOR QUANTUM DOTS; TRANSISTORS;

EID: 84936805188     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/acs.nanolett.5b01429     Document Type: Article
Times cited : (25)

References (29)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.