Imaging screw dislocations at atomic resolution by aberration-corrected electron optical sectioning

Nature Communications

Volumn 6, Issue , 2015, Pages

  Yang, H ^a   Lozano, J G ^a   Pennycook, T J ^a,b,c   Jones, L ^a   Hirsch, P B ^a   Nellist, P D ^a,b  

^a UNIVERSITY OF OXFORD   (United Kingdom)

^b SUPERSTEM LABORATORY   (United Kingdom)

^c UNIVERSITY OF VIENNA   (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; IMAGE RESOLUTION; IMAGING METHOD; OPTICAL METHOD; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR INDUSTRY;

ANALYTIC METHOD; ARTICLE; DISSOCIATION; ELECTRON BEAM; ELECTRON MICROSCOPY; OPTICS; SIMULATION; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84930657800     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms8266     Document Type: Article

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