메뉴 건너뛰기




Volumn 25, Issue 1, 2014, Pages 254-263

UnSync-CMP: Multicore CMP architecture for energy-efficient soft-error reliability

Author keywords

CMP; Multicore architecture; power efficiency; reliability; soft error

Indexed keywords

BENCHMARKING; COST REDUCTION; ENERGY EFFICIENCY; ERROR CORRECTION; ERRORS; HARDWARE; MICROPROCESSOR CHIPS; MULTIPROCESSING SYSTEMS; RADIATION HARDENING; REDUNDANCY; RELIABILITY; SOFTWARE ARCHITECTURE;

EID: 84930653090     PISSN: 10459219     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPDS.2013.14     Document Type: Article
Times cited : (11)

References (28)
  • 3
    • 77954030094 scopus 로고    scopus 로고
    • Impact of scaling on neutron-induced soft error in srams from a 250 nm to a 22 nm design rule
    • July
    • E. Ibe, H. Taniguchi, Y. Yahagi, K.-i. Shimbo, and T. Toba, "Impact of Scaling on Neutron-Induced Soft Error in SRAMs From a 250 nm to a 22 nm Design Rule, " IEEE Trans. Electron Devices, vol. 57, no. 7, pp. 1527-1538, July 2010.
    • (2010) IEEE Trans. Electron Devices , vol.57 , Issue.7 , pp. 1527-1538
    • Ibe, E.1    Taniguchi, H.2    Yahagi, Y.3    Shimbo, K.-I.4    Toba, T.5
  • 15
    • 0032667728 scopus 로고    scopus 로고
    • IBM's S/390 G5 microprocessor design
    • Mar.
    • T.J. Slegel et al., "IBM's S/390 G5 Microprocessor Design, " IEEE Micro, vol. 19, no. 2, pp. 12-23, Mar. 1999.
    • (1999) IEEE Micro , vol.19 , Issue.2 , pp. 12-23
    • Slegel, T.J.1
  • 24
    • 58149131807 scopus 로고    scopus 로고
    • DDMR: Dynamic and scalable dual modular redundancy with short validation intervals
    • July
    • A. Golander, S. Weiss, and R. Ronen, "DDMR: Dynamic and Scalable Dual Modular Redundancy with Short Validation Intervals, " Computer Architecture Letters, vol. 7, no. 2, pp. 65-68, July 2008.
    • (2008) Computer Architecture Letters , vol.7 , Issue.2 , pp. 65-68
    • Golander, A.1    Weiss, S.2    Ronen, R.3
  • 26
    • 79951714116 scopus 로고    scopus 로고
    • AVF stressmark: Towards an automated methodology for bounding the worst-case vulnerability to soft errors
    • A.A. Nair, L.K. John, and L. Eeckhout, "AVF Stressmark: Towards an Automated Methodology for Bounding the Worst-Case Vulnerability to Soft Errors, " Proc. IEEE/ACM Int'l Symp. Microarchitecture (Micro), pp. 125-136, 2010.
    • (2010) Proc. IEEE/ACM Int'l Symp. Microarchitecture (Micro) , pp. 125-136
    • Nair, A.A.1    John, L.K.2    Eeckhout, L.3
  • 28


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.