-
1
-
-
39749189436
-
Design for board and system level structural test and diagnosis
-
Santa Clara, CA, USA, Nov.
-
T. Vo et al., "Design for board and system level structural test and diagnosis," in Proc. IEEE Int. Test Conf., Santa Clara, CA, USA, Nov. 2006, pp. 1-10.
-
(2006)
Proc. IEEE Int. Test Conf.
, pp. 1-10
-
-
Vo, T.1
-
2
-
-
84855424686
-
Fault diagnosis with orthogonal compactors in scan-based designs
-
B. Benware et al., "Fault diagnosis with orthogonal compactors in scan-based designs," J. Electron. Test. Theory Appl., vol. 27, no. 5, pp. 599-609, 2011.
-
(2011)
J. Electron. Test. Theory Appl.
, vol.27
, Issue.5
, pp. 599-609
-
-
Benware, B.1
-
3
-
-
0142246844
-
Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?
-
Charlotte, NC, USA, Nov.
-
K. P. Parker, "Defect coverage of boundary-scan tests: What does it mean when a boundary-scan test passes?" in Proc. IEEE Int. Test Conf., Charlotte, NC, USA, Nov. 2003, pp. 181-189.
-
(2003)
Proc. IEEE Int. Test Conf.
, pp. 181-189
-
-
Parker, K.P.1
-
4
-
-
84864216026
-
Reusing and retargeting on-chip instrument access procedures in IEEE P1687
-
Apr.
-
F. G. Zadegan, U. Ingelsson, E. Larsson, and G. Carlsson, "Reusing and retargeting on-chip instrument access procedures in IEEE P1687," IEEE Design Test Comput., vol. 29, no. 2, pp. 79-88, Apr. 2012.
-
(2012)
IEEE Design Test Comput.
, vol.29
, Issue.2
, pp. 79-88
-
-
Zadegan, F.G.1
Ingelsson, U.2
Larsson, E.3
Carlsson, G.4
-
5
-
-
33847146564
-
A model based automated debug process
-
Baltimore, MD, USA
-
D. Manley and B. Eklow, "A model based automated debug process," in Proc. IEEE Board Test Workshop, Baltimore, MD, USA, 2002, pp. 1-7.
-
(2002)
Proc. IEEE Board Test Workshop
, pp. 1-7
-
-
Manley, D.1
Eklow, B.2
-
6
-
-
0035435324
-
Fault diagnosis of electronic systems using intelligent techniques: A review
-
Aug.
-
W. G. Fenton, T. M. McGinnity, and L. P. Maguire, "Fault diagnosis of electronic systems using intelligent techniques: A review," IEEE Trans. Syst., Man, Cybern. C, Appl. Rev., vol. 31, no. 3, pp. 269-281, Aug. 2001.
-
(2001)
IEEE Trans. Syst. Man, Cybern. C, Appl. Rev.
, vol.31
, Issue.3
, pp. 269-281
-
-
Fenton, W.G.1
McGinnity, T.M.2
Maguire, L.P.3
-
7
-
-
33847099544
-
Optimized reasoningbased diagnosis for non-random, board-level, production defects
-
Austin, TX, USA Nov.
-
C. O'Farrill, M. Moakil-Chbany, and B. Eklow, "Optimized reasoningbased diagnosis for non-random, board-level, production defects," in Proc. IEEE Int. Test Conf., Austin, TX, USA, Nov. 2005, pp. 173-179.
-
(2005)
Proc. IEEE Int. Test Conf.
, pp. 173-179
-
-
O'Farrill, C.1
Moakil-Chbany, M.2
Eklow, B.3
-
8
-
-
84883403464
-
Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis
-
Avignon, France
-
F. Ye, Z. Zhang, K. Chakrabarty, and X. Gu, "Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis," in Proc. IEEE Eur. Test Symp., Avignon, France, 2013, pp. 1-6.
-
(2013)
Proc. IEEE Eur. Test Symp.
, pp. 1-6
-
-
Ye, F.1
Zhang, Z.2
Chakrabarty, K.3
Gu, X.4
-
9
-
-
84905258502
-
Information-theoretic framework for evaluating and guiding board-level functional-fault diagnosis
-
Jun.
-
F. Ye, K. Chakrabarty, Z. Zhang, and X. Gu, "Information-theoretic framework for evaluating and guiding board-level functional-fault diagnosis," IEEE Design Test Comput., vol. 31, no. 3, pp. 65-75, Jun. 2014.
-
(2014)
IEEE Design Test Comput.
, vol.31
, Issue.3
, pp. 65-75
-
-
Ye, F.1
Chakrabarty, K.2
Zhang, Z.3
Gu, X.4
-
10
-
-
77749242447
-
An incremental approach to functional diagnosis
-
Chicago, IL, USA
-
L. Amati et al., "An incremental approach to functional diagnosis," in Proc. IEEE Int. Symp. Defect Fault Tolerance VLSI Syst. (DFT), Chicago, IL, USA, 2009, pp. 392-400.
-
(2009)
Proc. IEEE Int. Symp. Defect Fault Tolerance VLSI Syst. (DFT)
, pp. 392-400
-
-
Amati, L.1
-
11
-
-
84891310931
-
A data mining approach to incremental adaptive functional diagnosis
-
New York, NY, USA
-
C. Bolchini, E. Quintarelli, F. Salice, and P. Garza, "A data mining approach to incremental adaptive functional diagnosis," in Proc. IEEE Int. Symp. Defect Fault Tolerance VLSI Nanotechnol. Syst. (DFT), New York, NY, USA, 2013, pp. 13-18.
-
(2013)
Proc. IEEE Int. Symp. Defect Fault Tolerance VLSI Nanotechnol. Syst. (DFT)
, pp. 13-18
-
-
Bolchini, C.1
Quintarelli, E.2
Salice, F.3
Garza, P.4
-
12
-
-
84876757483
-
Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting
-
May
-
F. Ye, Z. Zhang, K. Chakrabarty, and X. Gu, "Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting," IEEE Trans. Comput.-Aided Design Integr. Circuits Syst., vol. 32, no. 5, pp. 723-736, May 2013.
-
(2013)
IEEE Trans. Comput.-Aided Design Integr. Circuits Syst.
, vol.32
, Issue.5
, pp. 723-736
-
-
Ye, F.1
Zhang, Z.2
Chakrabarty, K.3
Gu, X.4
-
13
-
-
84872573407
-
Adaptive board-level functional fault diagnosis using decision trees
-
Niigata, Japan, Oct.
-
F. Ye, Z. Zhang, K. Chakrabarty, and X. Gu, "Adaptive board-level functional fault diagnosis using decision trees," in Proc. IEEE Asian Test Symp., Niigata, Japan, Oct. 2012, pp. 202-207.
-
(2012)
Proc. IEEE Asian Test Symp.
, pp. 202-207
-
-
Ye, F.1
Zhang, Z.2
Chakrabarty, K.3
Gu, X.4
-
14
-
-
84891503513
-
AgentDiag: An agent-assisted diagnostic framework for board-level functional failures
-
Anaheim, CA, USA
-
Z. Sun et al., "AgentDiag: An agent-assisted diagnostic framework for board-level functional failures," in Proc. IEEE Int. Test Conf., Anaheim, CA, USA, 2013, pp. 1-8.
-
(2013)
Proc. IEEE Int. Test Conf.
, pp. 1-8
-
-
Sun, Z.1
-
15
-
-
84859002167
-
Physical-defect modeling and optimization for fault-insertion test
-
Apr.
-
Z. Zhang, Z. Wang, X. Gu, and K. Chakrabarty, "Physical-defect modeling and optimization for fault-insertion test," IEEE Trans. Very Large Scale Integr. (VLSI) Syst., vol. 20, no. 4, pp. 723-736, Apr. 2012.
-
(2012)
IEEE Trans. Very Large Scale Integr. (VLSI) Syst.
, vol.20
, Issue.4
, pp. 723-736
-
-
Zhang, Z.1
Wang, Z.2
Gu, X.3
Chakrabarty, K.4
-
16
-
-
24344458137
-
Feature selection based on mutual information criteria of max-dependency, max-relevance, and minredundancy
-
Aug.
-
H. Peng, F. Long, and C. Ding, "Feature selection based on mutual information criteria of max-dependency, max-relevance, and minredundancy," IEEE Trans. Pattern Anal. Mach. Intell., vol. 27, no. 8, pp. 1226-1238, Aug. 2005.
-
(2005)
IEEE Trans. Pattern Anal. Mach. Intell.
, vol.27
, Issue.8
, pp. 1226-1238
-
-
Peng, H.1
Long, F.2
Ding, C.3
-
18
-
-
0003905759
-
-
New York, NY USA Wiley
-
E. Oja, A. Hyvarinen, and J. Karhunen, Independent Component Analysis. New York, NY, USA: Wiley, 2001.
-
(2001)
Independent Component Analysis.
-
-
Oja, E.1
Hyvarinen, A.2
Karhunen, J.3
-
20
-
-
0018015137
-
Modeling by shortest data description
-
J. Rissanen, "Modeling by shortest data description," Automatica, vol. 14, no. 5, pp. 465-471, 1978.
-
(1978)
Automatica
, vol.14
, Issue.5
, pp. 465-471
-
-
Rissanen, J.1
-
21
-
-
0004060921
-
-
Ph.D. dissertation Dept. Comput. Sci., University of Waikato, Hamilton, New Zealand
-
M. A. Hall, "Correlation-based feature selection for machine learning," Ph.D. dissertation, Dept. Comput. Sci., University of Waikato, Hamilton, New Zealand, 1999.
-
(1999)
Correlation-based Feature Selection for Machine Learning
-
-
Hall, M.A.1
-
22
-
-
76749092270
-
The WEKA data mining software: An update
-
M. Hall et al., "The WEKA data mining software: An update," ACM SIGKDD Explor. Newslett., vol. 11, no. 1, pp. 10-18, 2009.
-
(2009)
ACM SIGKDD Explor. Newslett.
, vol.11
, Issue.1
, pp. 10-18
-
-
Hall, M.1
-
23
-
-
85013962378
-
Knowledge discovery and knowledge transfer in board-level functional fault diagnosis
-
Seattle, WA, USA
-
F. Ye, K. Chakrabarty, Z. Zhang, and X. Gu, "Knowledge discovery and knowledge transfer in board-level functional fault diagnosis," in Proc. IEEE Int. Test Conf., Seattle, WA, USA, 2014, pp. 1-10.-
-
(2014)
Proc. IEEE Int. Test Conf.
, pp. 1-10
-
-
Ye, F.1
Chakrabarty, K.2
Zhang, Z.3
Gu, X.4
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