An incremental approach to functional diagnosis

Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

Volumn , Issue , 2009, Pages 392-400

  Amati, L ^a   Bolchini, C ^a   Frigerio, L ^a   Salice, F ^a   Eklow, B ^b   Suvatne, A ^b   Brambilla, E ^c   Franzoso, F ^c   Martin, M ^c  

^a POLITECNICO DI MILANO   (Italy)

^b CISCO SYSTEMS   (United States)

^c Cisco Photonics Italy   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FUNCTIONAL FAULTS; INCREMENTAL APPROACH; TEST RUNS;

DEFECTS; FAILURE ANALYSIS; FAULT TOLERANT COMPUTER SYSTEMS; PROBABILITY DENSITY FUNCTION; QUALITY ASSURANCE; TESTING;

FAULT TOLERANCE;

EID: 77749242447     PISSN: 15505774     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DFT.2009.29     Document Type: Conference Paper

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