Ultrafast lattice response of photoexcited thin films studied by X-ray diffraction

Structural Dynamics

Volumn 1, Issue 6, 2014, Pages

  Schick, Daniel ^a,b   Herzog, Marc ^a,c   Bojahr, André ^a   Leitenberger, Wolfram ^a   Hertwig, Andreas ^d   Shayduk, Roman ^b,e   Bargheer, Matias ^a,b  

^a UNIVERSITY OF POTSDAM   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

^c FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^d BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^e DESY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACOUSTIC IMPEDANCE; LATTICE VIBRATIONS; RUTHENIUM COMPOUNDS; STRESS ANALYSIS; STRONTIUM TITANATES; SUBSTRATES; TITANIUM COMPOUNDS; X RAY DIFFRACTION;

LATTICE RESPONSE; LIMITING CASE; PHOTO-INDUCED STRESS; SPATIAL PROFILES; SRTIO3 SUBSTRATES; TRANSPARENT SUBSTRATE; TWO PARAMETER; ULTRAFAST X-RAY DIFFRACTION;

THIN FILMS;

EID: 84929194928     PISSN: None     EISSN: 23297778     Source Type: Journal    
DOI: 10.1063/1.4901228     Document Type: Article

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