Probing impulsive strain propagation with x-ray pulses

Physical Review Letters

Volumn 86, Issue 14, 2001, Pages 3072-3075

  Reis, D A ^a   DeCamp, M F ^a   Bucksbaum, P H ^a   Clarke, R ^a   Dufresne, E ^a   Hertlein, M ^a   Merlin, R ^a   Falcone, R ^b   Kapteyn, H ^c   Murnane, M ^c   Larsson, J ^d   Missalla, Th ^d   Wark, J ^e  

^a UNIVERSITY OF MICHIGAN   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF COLORADO   (United States)

^d LUND INSTITUTE OF TECHNOLOGY   (Sweden)

^e UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; LASER BEAM EFFECTS; LIGHT REFLECTION; MATHEMATICAL MODELS; STRAIN; ULTRAFAST PHENOMENA; X RAY DIFFRACTION ANALYSIS;

STRAIN PROPAGATION;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0000987696     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.86.3072     Document Type: Article

References (24)