Ultrafast reciprocal-space mapping with a convergent beam

Journal of Applied Crystallography

Volumn 46, Issue 5, 2013, Pages 1372-1377

  Schick, Daniel ^a   Shayduk, Roman ^c   Bojahr, André ^a   Herzog, Marc ^a,b   Von Korff Schmising, Clemens ^d   Gaal, Peter ^c   Bargheer, Matias ^a,c  

^a UNIVERSITY OF POTSDAM   (Germany)

^b FRITZ HABER INSTITUT DER MAX PLANCK GESELLSCHAFT   (Germany)

^c HAHN MEITNER INSTITUT   (Germany)

^d TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

convergent beams; plasma X ray sources; reciprocal space mapping; resolution functions; time resolved X ray diffraction

Indexed keywords

DIFFRACTOMETERS; ELECTRON SOURCES; LASER PRODUCED PLASMAS; MAPPING; X RAY APPARATUS; X RAY DIFFRACTION; X RAY OPTICS;

CONVERGENT BEAMS; PLASMA X-RAY SOURCES; RECIPROCAL SPACE MAPPING; RESOLUTION FUNCTION; TIME RESOLVED X-RAY DIFFRACTIONS;

X RAY DETECTORS;

EID: 84884537385     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889813020013     Document Type: Article

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