Co-registered topographical, band excitation nanomechanical, and mass spectral imaging using a combined atomic force microscopy/mass spectrometry platform

ACS Nano

Volumn 9, Issue 4, 2015, Pages 4260-4269

  Ovchinnikova, Olga S ^a   Tai, Tamin ^a   Bocharova, Vera ^a   Okatan, Mahmut Baris ^a   Belianinov, Alex ^a   Kertesz, Vilmos ^a   Jesse, Stephen ^a   Van Berkel, Gary J ^a  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

Author keywords

atmospheric pressure; atmospheric pressure chemical ionization; atomic force microscopy; band excitation; mass spectrometry imaging; thermal desorption; topography

Indexed keywords

ATMOSPHERIC CHEMISTRY; ATMOSPHERIC IONIZATION; ATMOSPHERIC PRESSURE; ATOMIC FORCE MICROSCOPY; BLENDING; CHEMICAL ANALYSIS; GAS DYNAMICS; IONIZATION; IONIZATION OF GASES; MASS SPECTROMETRY; SPECTROMETRY; SPECTROSCOPY; SURFACE MEASUREMENT; SURFACE TOPOGRAPHY; THERMAL DESORPTION; THIN FILMS;

ATMOSPHERIC PRESSURE CHEMICAL IONIZATION; BAND EXCITATIONS; GAS-PHASE SPECIES; MASS-SPECTROMETRY IMAGING; MULTI-MODAL IMAGING; SPATIAL RESOLUTION; THIN FILM SURFACES; TOPOGRAPHY IMAGES;

TOPOGRAPHY;

EID: 84929094013     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b00659     Document Type: Article

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