Modeling the effect of subsurface interface defects on contact stiffness for ultrasonic atomic force microscopy

Applied Physics Letters

Volumn 84, Issue 26, 2004, Pages 5368-5370

  Sarioglu, A F ^a   Atalar, A ^a   Degertekin, F L ^b  

^a BILKENT UNIVERSITY   (Turkey)

^b GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISBONDS; SUBSURFACE DETECTION; SUBSURFACE INTERFACE; SURFACE IMPEDANCE;

ALGORITHMS; ATOMIC FORCE MICROSCOPY; BOUNDARY CONDITIONS; DEFECTS; ELECTRONIC STRUCTURE; ITERATIVE METHODS; SUBSTRATES; ULTRASONICS;

STIFFNESS;

EID: 3242723363     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1764941     Document Type: Article

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