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Materials Science in Semiconductor Processing

Volumn 38, Issue , 2015, Pages 249-256

Electrical analysis of Al/ZnO/p-Si, Al/PMMA/p-Si and Al/PMMA/ZnO/p-Si structures: Comparison study

(4) Bilge Ocak, S a Selcuk A B b Aras, G a Orhan, E a

a GAZI UNIVERSITY (Turkey)

b Sarakoy Nuclear Research and Training Centre (Turkey)

Author keywords

Electrical properties; Heterojunction; Organic thin film; Schottky barrier diode

Indexed keywords

ALUMINUM COATINGS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; HETEROJUNCTIONS; POLYMETHYL METHACRYLATES; SCHOTTKY BARRIER DIODES;

CAPACITANCE-VOLTAGE CURVE; ELECTRICAL ANALYSIS; ELECTRICAL CHARACTERISTIC; ELECTRONIC PERFORMANCE; MEASURED CURRENTS; ORGANIC THIN FILMS; SERIES RESISTANCES; ZNO/P-SI HETEROJUNCTIONS;

ALUMINUM;

EID: 84929093040 PISSN: 13698001 EISSN: None Source Type: Journal
DOI: 10.1016/j.mssp.2015.04.030 Document Type: Article

Times cited : (18)

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