SCOPUS 정보 검색 플랫폼

Journal of Electronic Materials

Volumn 43, Issue 9, 2014, Pages 3263-3269

Electrical characteristics of Al/poly(methyl methacrylate)/p-Si Schottky device

(4) Selcuk A B a Bilge Ocak, S b Aras, F G b Oz Orhan, E b

a Sarakoy Nuclear Research and Training Centre (Turkey)

b GAZI UNIVERSITY (Turkey)

Author keywords

electrical properties; Electronic materials; interfaces; organic compounds; semiconductors

Indexed keywords

ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ESTERS; INTERFACES (MATERIALS); ORGANIC COMPOUNDS; SEMICONDUCTOR MATERIALS;

BIAS VOLTAGE AND FREQUENCY; ELECTRICAL CHARACTERISTIC; ELECTRONIC MATERIALS; I-V AND C-V CHARACTERISTICS; INTERFACE STATE DENSITY; INTERFACE STATES DENSITY; INTERFACIAL INSULATOR LAYER; METHYL METHACRYLATES;

SILICON;

EID: 84906320156 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-014-3267-2 Document Type: Article

Times cited : (13)

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