Dielectric function in the spectral range (0.5-8.5)eV of an (Alx Ga1-x)2O3 thin film with continuous composition spread

Journal of Applied Physics

Volumn 117, Issue 16, 2015, Pages

  Schmidt Grund, R ^a   Kranert, C ^a   Von Wenckstern, H ^a   Zviagin, V ^a   Lorenz, M ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONIC PROPERTIES; SPECTROSCOPIC ELLIPSOMETRY;

ABSORPTION CO-EFFICIENT; COMPOSITION RANGES; CONTINUOUS COMPOSITION SPREADS; DEVICE ENGINEERING; DIELECTRIC FUNCTIONS; ENERGY PARAMETERS; SINGLE-PHASE MATERIALS; WIDE SPECTRAL RANGE;

REFRACTIVE INDEX;

EID: 84928922988     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4919088     Document Type: Article

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