Accurate sizing of ceria oxide nanoparticles in slurries by the analysis of the optical forward-scattered field

Journal of Nanoparticle Research

Volumn 17, Issue 2, 2015, Pages

  Potenza, Marco A C ^a,b   Sanvito, Tiziano ^c   Pullia, Alberto ^a  

^a UNIVERSITY OF MILAN   (Italy)

^b CIMaINa   (Italy)

^c WISE Sr L   (Italy)

Author keywords

Ceria; Chemical mechanical polishing; Light scattering; Particle characterization; Refractive index; Slurries

Indexed keywords

CERIUM COMPOUNDS; CHEMICAL MECHANICAL POLISHING; CHEMICAL POLISHING; LIGHT SCATTERING; NANOPARTICLES; PARTICLE SIZE; PARTICLE SIZE ANALYSIS; REFRACTIVE INDEX; SLURRIES; SUSPENSIONS (FLUIDS);

CERIA NANOPARTICLES; DATA INTERPRETATION; EXTINCTION CROSS SECTION; OXIDE NANOPARTICLES; PARTICLE CHARACTERIZATION; PRECISE MEASUREMENTS; SCATTERED FIELD; SIMULTANEOUS MEASUREMENT;

FORWARD SCATTERING;

CERIUM OXIDE NANOPARTICLE;

ARTICLE; CONTROLLED STUDY; INDUSTRY AND INDUSTRIAL PHENOMENA; LIGHT SCATTERING; MEASUREMENT ACCURACY; PARTICLE SIZE; PRIORITY JOURNAL; REFRACTION INDEX; SLURRY;

EID: 84928400805     PISSN: 13880764     EISSN: 1572896X     Source Type: Journal    
DOI: 10.1007/s11051-015-2925-5     Document Type: Article

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