메뉴 건너뛰기




Volumn , Issue , 2015, Pages 106-111

Technological exploration of RRAM crossbar array for matrix-vector multiplication

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER AIDED DESIGN; ECONOMIC AND SOCIAL EFFECTS; ENERGY EFFICIENCY; METALS; PATTERN RECOGNITION; SUPPORT VECTOR MACHINES; VECTORS;

EID: 84926459123     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.2015.7058989     Document Type: Conference Paper
Times cited : (74)

References (20)
  • 1
    • 33750919950 scopus 로고    scopus 로고
    • Energy-and time-efficient matrix multiplication on fpgas
    • J.-W. Jang, S. B. Choi, and V. K. Prasanna, "Energy-and time-efficient matrix multiplication on fpgas," TVLSI, 2005.
    • (2005) TVLSI
    • Jang, J.-W.1    Choi, S.B.2    Prasanna, V.K.3
  • 3
    • 79957568212 scopus 로고    scopus 로고
    • Design implications of memristor-based rram cross-point structures
    • C. Xu et al., "Design implications of memristor-based rram cross-point structures," in DATE, 2011.
    • (2011) DATE
    • Xu, C.1
  • 4
    • 84903831990 scopus 로고    scopus 로고
    • Energy efficient neural networks for big data analytics
    • Y. Wang, B. Li, R. Luo, Y. Chen, N. Xu, and H. Yang, "Energy efficient neural networks for big data analytics," in DATE, 2014.
    • (2014) DATE
    • Wang, Y.1    Li, B.2    Luo, R.3    Chen, Y.4    Xu, N.5    Yang, H.6
  • 5
    • 84863553133 scopus 로고    scopus 로고
    • Hardware realization of bsb recall function using memristor crossbar arrays
    • M. Hu et al., "Hardware realization of bsb recall function using memristor crossbar arrays," in DAC, 2012.
    • (2012) DAC
    • Hu, M.1
  • 6
    • 84889601634 scopus 로고    scopus 로고
    • Memristor-based approximated computation
    • B. Li et al., "Memristor-based approximated computation," in ISLPED, 2013.
    • (2013) ISLPED
    • Li, B.1
  • 8
    • 84897828040 scopus 로고    scopus 로고
    • Training itself: Mixed-signal training acceleration for memristor-based neural network
    • B. Li et al., "Training itself: Mixed-signal training acceleration for memristor-based neural network." in ASP-DAC, 2014.
    • (2014) ASP-DAC
    • Li, B.1
  • 9
    • 84872848395 scopus 로고    scopus 로고
    • Rram crossbar array with cell selection device: A device and circuit interaction study
    • Y. Deng et al., "Rram crossbar array with cell selection device: A device and circuit interaction study," TED, 2013.
    • (2013) TED
    • Deng, Y.1
  • 11
    • 84875158827 scopus 로고    scopus 로고
    • A low energy oxide-based electronic synaptic device for neuromorphic visual systems with tolerance to device variation
    • S. Yu et al., "A low energy oxide-based electronic synaptic device for neuromorphic visual systems with tolerance to device variation," Advanced Materials, 2013.
    • (2013) Advanced Materials
    • Yu, S.1
  • 12
    • 79956129424 scopus 로고    scopus 로고
    • Analog memory and spike-timing-dependent plasticity characteristics of a nanoscale titanium oxide bilayer resistive switching device
    • K. Seo et al., "Analog memory and spike-timing-dependent plasticity characteristics of a nanoscale titanium oxide bilayer resistive switching device," Nanotechnology, 2011.
    • (2011) Nanotechnology
    • Seo, K.1
  • 13
    • 80053298117 scopus 로고    scopus 로고
    • Short-term memory to long-term memory transition in a nanoscale memristor
    • T. Chang, S.-H. Jo, and W. Lu, "Short-term memory to long-term memory transition in a nanoscale memristor," ACS nano, 2011.
    • (2011) ACS Nano
    • Chang, T.1    Jo, S.-H.2    Lu, W.3
  • 14
    • 84926480255 scopus 로고    scopus 로고
    • Multilayer-based forming-free rram devices with excellent uniformity
    • Z. Fang et al., "Multilayer-based forming-free rram devices with excellent uniformity," IEEE Electron Device Letters, 2011.
    • (2011) IEEE Electron Device Letters
    • Fang, Z.1
  • 16
    • 84926446972 scopus 로고    scopus 로고
    • Sneak-path testing of crossbar-based nonvolatile random access memories
    • S. Kannan et al., "Sneak-path testing of crossbar-based nonvolatile random access memories," TNANO, 2013.
    • (2013) TNANO
    • Kannan, S.1
  • 18
    • 84876569386 scopus 로고    scopus 로고
    • Filament scaling forming technique and levelverify-write scheme with endurance over 107 cycles in reram
    • A. Kawahara et al., "Filament scaling forming technique and levelverify-write scheme with endurance over 107 cycles in reram," in ISSCC, 2013.
    • (2013) ISSCC
    • Kawahara, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.