Combined raman microspectrometer and shearforce regulated SECM for corrosion and self-healing analysis

Analytical Chemistry

Volumn 86, Issue 22, 2014, Pages 11203-11210

  Etienne, Mathieu ^a   Dossot, Manuel ^a   Grausem, Jérôme ^a   Herzog, Grégoire ^a  

^a UNIVERSITÉ DE LORRAINE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM COATINGS; ASPECT RATIO; CHEMICAL ANALYSIS; CHEMICAL DETECTION; CORROSION; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

CONFOCAL RAMAN MICROSPECTROSCOPY; ELECTROCHEMICAL MEASUREMENTS; ELECTRODE POSITIONING; MICRO-SPECTROMETER; RAMAN MICROSPECTROMETRY; SCANNING ELECTROCHEMICAL MICROSCOPY; SELF-HEALING COATING; SPECTROCHEMICAL ANALYSIS;

ANALYTIC EQUIPMENT;

EID: 84922567686     PISSN: 00032700     EISSN: 15206882     Source Type: Journal    
DOI: 10.1021/ac502670t     Document Type: Article

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