Study of defects in CdTe heterostructures using imaging confocal photoluminescence and photoluminescence intensity measurements

2014 IEEE 40th Photovoltaic Specialist Conference, PVSC 2014

Volumn , Issue , 2014, Pages 2419-2424

  Swartz, Craig H ^a   Noriega, Odille C ^a   Jayathilaka, Pathiraja A R D ^a   Edirisooriya, Madhavie ^a   Zhao, Xin Hao ^b,c   Dinezza, Michael J ^c   Liu, Shi ^c   Zhang, Yong Hang ^c   Myers, Thomas H ^a  

^a TEXAS STATE UNIVERSITY   (United States)

^b Materials Science and Engineering Graduate Program   (United States)

^c Arizona State University   (United States)

Author keywords

CdTe; molecular beam epitaxy; photoluminescence; Surface passivation

Indexed keywords

CADMIUM TELLURIDE; MOLECULAR BEAM EPITAXY; PHOTOLUMINESCENCE;

CDTE; CONFOCAL PHOTOLUMINESCENCES; INTERFACE STATE DENSITY; LOW-DISLOCATION DENSITY; NONRADIATIVE DEFECTS; PHOTOLUMINESCENCE INTENSITIES; PHOTOVOLTAIC APPLICATIONS; SURFACE PASSIVATION;

INTERFACE STATES;

EID: 84912101564     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2014.6925416     Document Type: Conference Paper

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