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Volumn 4, Issue 102, 2014, Pages 58553-58558

A successive photocurrent transient study to probe the sub-band gap electron and hole traps in ZnO nanorods

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; ELECTRON TRAPS; ELECTRONS; HOLE TRAPS; NANORODS; PHOTOCURRENTS; SEMICONDUCTOR QUANTUM WELLS; ZINC OXIDE;

EID: 84911894914     PISSN: None     EISSN: 20462069     Source Type: Journal    
DOI: 10.1039/c4ra11986j     Document Type: Article
Times cited : (26)

References (49)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.