Improvement of physical properties of ZnO thin films by tellurium doping

Applied Surface Science

Volumn 318, Issue , 2014, Pages 319-323

  Sönmezoʇlu, Savaş ^a   Akman, Erdi ^a  

^a Karamanolu Mehmetbey University   (Turkey)

Author keywords

Microstructure and optical properties; Sol gel method; Te doped ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLITE SIZE; ENERGY GAP; II-VI SEMICONDUCTORS; LIGHT TRANSMISSION; METALLIC FILMS; OPTICAL PROPERTIES; OXIDE FILMS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR DOPING; SOL-GEL PROCESS; SOL-GELS; SURFACE ROUGHNESS; TELLURIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

ABSORPTION EDGES; CRYSTALLINITIES; DOPED ZNO; DOPED ZNO THIN FILMS; MORPHOLOGICAL PROPERTIES; OPTICAL TRANSMISSION SPECTRUM; PREFERENTIAL ORIENTATION; X-RAY DIFFRACTION MEASUREMENTS;

OPTICAL FILMS;

EID: 84909944387     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2014.06.187     Document Type: Conference Paper

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