Probing the stress effect on the electronic structure of graphite by resonant Raman spectroscopy

Journal of Physical Chemistry C

Volumn 118, Issue 43, 2014, Pages 25132-25140

  Peña Álvarez, Miriam ^a   Del Corro, Elena ^a   Baonza, Valentín G ^a   Taravillo, Mercedes ^a  

^a UNIVERSIDAD COMPLUTENSE DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

DISPERSION (WAVES); ELECTRONIC STRUCTURE; EXCITATION ENERGY; MINERALS; SILICON CARBIDE;

DISPERSIVE BEHAVIORS; EXCITATION WAVELENGTH; HIGHLY ORIENTED PYROLYTIC GRAPHITE; MOISSANITE ANVIL CELLS; PRESSURE DEVICES; RESONANT PROCESS; RESONANT RAMAN SPECTROSCOPY; STRESS COEFFICIENTS;

GRAPHITE;

EID: 84908577168     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp505730v     Document Type: Article

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