Bonding Changes in Compressed Superhard Graphite

Science

Volumn 302, Issue 5644, 2003, Pages 425-427

  Mao, Wendy L ^a,d   Mao, Ho Kwang ^a,d   Eng, Peter J ^b,c   Trainor, Thomas P ^b,g   Newville, Matthew ^b   Kao, Chi Chang ^e   Heinz, Dion L ^a,c   Shu, Jinfu ^d   Meng, Yue ^f   Hemley, Russell J ^d  

^a UNIVERSITY OF CHICAGO   (United States)

^b UNIVERSITY OF CHICAGO   (United States)

^c UNIVERSITY OF CHICAGO   (United States)

^d GEOPHYSICAL LABORATORY   (United States)

^e BROOKHAVEN NATIONAL LABORATORY   (United States)

^f ARGONNE NATIONAL LABORATORY   (United States)

^g UNIVERSITY OF ALASKA FAIRBANKS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDS; PRESSURE EFFECTS; SINGLE CRYSTALS; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

GRAPHITE LAYERS;

GRAPHITE;

CARBON; GRAPHITE;

ARTICLE; CHEMICAL BINDING; COMPRESSION; CRYSTAL; ENVIRONMENTAL TEMPERATURE; PHASE TRANSITION; PRIORITY JOURNAL; SPECTROSCOPY; SYNCHROTRON; X RAY; X RAY DIFFRACTION;

EID: 0142084742     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1089713     Document Type: Article

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17. We thank GSECARS, APS, and ANL for beam time and V. Prakapenka for help with x-ray diffraction. Use of the HPCAT facility was supported by U.S. Department of Energy (DOE)-Basic Energy Sciences, DOE-National Nuclear Security Administration, NSF, Department of Defense-Tank-Automotive and Armaments Command, and the W. M. Keck Foundation.