SCOPUS 정보 검색 플랫폼

Volumn 132, Issue , 2015, Pages 342-347

Investigation of micro-electrical properties of Cu2ZnSnSe4 thin films using scanning probe microscopy

(6) Jiang, C S a Repins, I L a Beall, C a Moutinho, H R a Ramanathan, K a Al Jassim, M M a

a NATIONAL RENEWABLE ENERGY LABORATORY (United States)

Author keywords

CZTSe; Grain boundary; Scanning Kelvin probe force microscopy; Scanning spreading resistance microscopy; Solar cell, thin film

Indexed keywords

CZTSE; SCANNING KELVIN PROBE FORCE MICROSCOPY; SCANNING SPREADING RESISTANCE MICROSCOPY;

GRAIN BOUNDARIES;

EID: 84907637728 PISSN: 09270248 EISSN: None Source Type: Journal
DOI: 10.1016/j.solmat.2014.08.046 Document Type: Article

Times cited : (25)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.