Friction force microscopy studies on SiO2 supported pristine and hydrogenated graphene

Applied Physics Letters

Volumn 104, Issue 4, 2014, Pages

  Fessler, Gregor ^a   Eren, Baran ^a   Gysin, Urs ^a   Glatzel, Thilo ^a   Meyer, Ernst ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

GRAPHENE; HYDROGENATION; TRIBOLOGY;

CLEAN SURFACES; CONTINUOUS SCANNING; FRICTION FORCE; FRICTION FORCE MICROSCOPY; FRICTIONAL BEHAVIOR; MECHANICAL TREATMENTS; PLASMA HYDROGENATED; RAMAN IMAGING;

FRICTION;

EID: 84906947669     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4863832     Document Type: Article

References (38)

1. N. Bhushan, Principles and Applications of Tribology (Wiley, New York, 1999).
2. K.-S. Kim, H.-J. Lee, C. Lee, S.-K. Lee, H. Jang, J.-H. Ahn, J.-H. Kim, and H.-J. Lee, ACS Nano 5, 5107 (2011). 10.1021/nn2011865
3. W. A. de Heer, MRS Bull. 36, 632 (2011). 10.1557/mrs.2011.158
4. X. Li, W. Cai, J. An, S. Kim, J. Nah, D. Yang, R. Piner, A. Velamakanni, I. Jung, E. Tutuc, S. K. Banerjee, L. Colombo, and R. S. Ruoff, Science 324, 1312 (2009). 10.1126/science.1171245
5. J. C. Meyer, A. K. Geim, M. I. Katsnelson, K. S. Novoselov, T. J. Booth, and S. Roth, Nature 446, 60 (2007). 10.1038/nature05545
6. R. R. Nair, P. Blake, A. N. Grigorenko, K. S. Novoselov, T. J. Booth, T. Stauber, N. M. R. Peres, and A. K. Geim, Science 320, 1308 (2008). 10.1126/science.1156965
7. U. Bangert, M. Gass, R. Zan, and C. T. Pan, " Scanning transmission electron microscopy and spectroscopy of suspended graphene," in Physics and Applications of Graphene-Experiments, edited by S. Mikhailov (InTech, 2011).
8. R. S. Pantelic, J. C. Meyer, U. Kaiser, and H. Stahlberg, Solid State Commun. 152, 1375 (2012). 10.1016/j.ssc.2012.04.038
9. H. Park, P. R. Brown, V. Bulovic, and J. Kong, Nano Lett. 12, 133 (2012). 10.1021/nl2029859
10. C. R. Dean, A. F. Young, I. Meric, C. Lee, L. Wang, S. Sorgenfrei, K. Watanabe, T. Taniguchi, P. Kim, and K. L. S. J. Hone, Nat. Nanotechnol. 5, 722 (2010). 10.1038/nnano.2010.172
11. Z. Cheng, Q. Zhou, C. Wang, Q. Li, C. Wang, and Y. Fang, Nano Lett. 11, 767 (2011). 10.1021/nl103977d
12. A. Nourbakhsh, M. Cantoro, A. Klekachev, F. Clemente, B. Sorëe, M. H. van der Veen, T. Vosch, A. Stesmans, B. Sels, and S. De Gendt, J. Phys. Chem. C 114, 6894 (2010). 10.1021/jp910085n
13. H. E. Romero, N. Shen, P. Joshi, H. R. Gutierrez, S. A. Tadigadapa, J. O. Sofo, and P. C. Eklund, ACS Nano 2, 2037 (2008). 10.1021/nn800354m
14. B. Eren, T. Glatzel, M. Kisiel, W. Fu, R. Pawlak, U. Gysin, C. Nef, L. Marot, M. Calame, C. Schonenberger, and E. Meyer, Appl. Phys. Lett. 102, 071602 (2013). 10.1063/1.4793197
15. H. S. Song, S. L. Li, H. Miyazaki, S. Sato, K. Hayashi, A. Yamada, N. Yokoyama, and K. Tsukagoshi, Sci. Rep. 2, 337 (2012).
16. A. Goossens, V. E. Calado, A. Barreiro, K. Watanabe, T. Taniguchi, and L. M. K. Vandersypen, Appl. Phys. Lett. 100, 073110 (2012). 10.1063/1.3685504
17. N. Lindvall, A. Kalabukhov, and A. Yurgens, J. Appl. Phys. 111, 064904 (2012). 10.1063/1.3695451
18. J. O. Sofo, A. S. Chaudhari, and G. D. Barber, Phys. Rev. B 75, 153401 (2007). 10.1103/PhysRevB.75.153401
19. W. Fu, C. Nef, O. Knopfmacher, A. Tasarov, M. Weiss, M. Calame, and C. Schönenberger, Nano Lett. 11, 3597 (2011). 10.1021/nl201332c
20. Y. G. Zhou, X. T. Zu, F. Gao, J. L. Nie, and H. Y. Xiao, J. Appl. Phys. 105, 014309 (2009). 10.1063/1.3056380
21. J. Bohdansky, J. Roth, and H. L. Bay, J. Appl. Phys. 51, 2861 (1980). 10.1063/1.327954
22. B. Eren, D. Hug, L. Marot, R. Pawlak, M. Kisiel, R. Steiner, D. M. Zumbühl, and E. Meyer, Beilstein J. Nanotechnol. 3, 852 (2012). 10.3762/bjnano.3.96
23. T. Filleter, J. L. McChesney, A. Bostwick, E. Rotenberg, K. V. Emtsev, T. Seyller, K. Horn, and R. Bennewitz, Phys. Rev. Lett. 102, 086102 (2009). 10.1103/PhysRevLett.102.086102
24. C. Lee, Q. Li, W. Kalb, X.-Z. Liu, H. Berger, R. W. Carpick, and J. Hone, Science 328, 76 (2010). 10.1126/science.1184167
25. X. Feng, S. Kwon, J. Y. Park, and M. Salmeron, ACS Nano 7, 1718 (2013). 10.1021/nn305722d
26. See supplementary material at http://dx.doi.org/10.1063/1.4863832 E-APPLAB-104-070405 for the videos showing the tip induced cleaning.
27. J. E. Sader, J. W. M. Chon, and P. Mulvaney, Rev. Sci. Instrum. 70, 3967 (1999). 10.1063/1.1150021
28. C. P. Green, H. Lioe, J. P. Cleveland, R. Proksch, P. Mulvaney, and J. E. Sader, Rev. Sci. Instrum. 75, 1988 (2004). 10.1063/1.1753100
29. F. Tuinstra and J. L. Koenig, J. Chem. Phys. 53, 1126 (1970). 10.1063/1.1674108
30. A. C. Ferrari and J. Robertson, Phys. Rev. B 61, 14095 (2000). 10.1103/PhysRevB.61.14095
31. A. C. Ferrari, J. C. Meyer, V. Scardaci, C. Casiraghi, M. Lazzeri, F. Mauri, S. Piscanec, D. Jiang, K. S. Novoselov, S. Roth, and A. K. Geim, Phys. Rev. Lett. 97, 187401 (2006). 10.1103/PhysRevLett.97.187401
32. A. C. Ferrari, Solid State Commun. 143, 47 (2007). 10.1016/j.ssc.2007.03.052
33. Y. Wang, X. Xu, J. Lu, M. Lin, Q. Bao, B. Özyilmaz, and K. P. Loh, ACS Nano 4, 6146 (2010). 10.1021/nn1017389
34. Z. Luo, T. Yu, Z. Ni, S. Lim, H. Hu, J. Shang, L. Liu, Z. Shen, and J. Lin, J. Phys. Chem. C 115, 1422 (2011). 10.1021/jp107109h
35. D. Dietzel, M. Feldmann, C. Herding, U. Schwarz, and A. Schirmeisen, Tribol. Lett. 39, 273 (2010). 10.1007/s11249-010-9643-z
36. D. Martinez-Martin, R. Longuinhos, J. G. Izquierdo, A. Marele, S. S. Alexandre, M. Jaafar, J. M. Gomez-Rodriguez, L. Bañares, J. M. Soler, and J. Gomez-Herrero, Carbon 61, 33 (2013). 10.1016/j.carbon.2013.04.056
37. W. H. Lee, J. Park, S. H. Sim, S. Lim, K. S. Kim, B. H. Hong, and K. Cho, J. Am. Chem. Soc. 133, 4447 (2011). 10.1021/ja1097463
38. B. H. Kim, S. J. Hong, S. J. Baek, H. Y. Jeong, N. Park, M. Lee, S. W. Lee, M. Park, S. W. Chu, H. S. Shin, J. Lim, J. C. Lee, Y. Jun, and Y. W. Park, Sci. Rep. 2, 690 (2012).