Noise spectroscopy of semiconductor materials and devices

2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings

Volumn 2, Issue , 2002, Pages 767-772

  Šikua, Josef ^a   Štourač, Ladislav ^b,c  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b NONE   (Czech Republic)

^c NONE   (Serbia)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CARRIER TRANSPORT; SEMICONDUCTOR JUNCTIONS;

CARRIER NUMBERS; DEVICE QUALITY; LOCALISED STATE; NOISE SPECTROSCOPY; QUANTUM TRANSITIONS; RELIABILITY INDICATORS; SINGLE CARRIER; TIME AND FREQUENCY DOMAINS;

MICROELECTRONICS;

EID: 84906716906     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MIEL.2002.1003370     Document Type: Conference Paper

References (19)

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