Noise and transport characterisation of tantalum capacitors

Microelectronics Reliability

Volumn 42, Issue 6, 2002, Pages 841-847

  Pavelka, Jan ^a   Sikula, Josef ^a   Vasina, Petr ^a   Sedlakova, Vlasta ^a   Tacano, Munecazu ^b   Hashiguchi, Sumihisa ^c  

^a BRNO UNIVERSITY OF TECHNOLOGY   (Czech Republic)

^b MEISEI UNIVERSITY   (Japan)

^c UNIVERSITY OF YAMANASHI   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CATHODES; CHARGE CARRIERS; CORRELATION METHODS; CRYSTALLIZATION; FREQUENCY DOMAIN ANALYSIS; SPURIOUS SIGNAL NOISE; TANTALUM;

TANTALUM CAPACITORS;

CAPACITORS;

EID: 0036603747     PISSN: 00262714     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0026-2714(02)00013-6     Document Type: Article

References (7)

1. 5 thin films for ionic conduction application
2. 2
3. Dielectric properties of manganese dioxide
4. Electrical properties of manganese dioxide and manganese sesquioxide
5. Electron transport mechanisms in thin insulating films