Interface optimization using diindenoperylene for C60 thin film transistors with high electron mobility and stability

Organic Electronics

Volumn 15, Issue 11, 2014, Pages 2749-2755

  Yang, Jin Peng ^a   Sun, Qi Jun ^b   Yonezawa, Keiichirou ^a   Hinderhofer, Alexander ^a   Gerlach, Alexander ^c   Broch, Katharina ^c   Bussolotti, Fabio ^a   Gao, Xu ^b   Li, Yanqing ^b   Tang, Jianxin ^b   Schreiber, Frank ^c   Ueno, Nobuo ^a   Wang, Sui Dong ^b   Kera, Satoshi ^a,d  

^a CHIBA UNIVERSITY   (Japan)

^b SOOCHOW UNIVERSITY   (China)

^c UNIVERSITY OF TÜBINGEN   (Germany)

^d INSTITUTE FOR MOLECULAR SCIENCE   (Japan)

Author keywords

Electron mobility; Grazing incidence X ray diffraction; Highly sensitive ultraviolet photoelectron spectroscopy; Organic thin film transistor

Indexed keywords

CHEMICAL SENSORS; ELECTRON MOBILITY; INTERFACES (MATERIALS); PHOTOELECTRONS; PHOTONS; PHOTOTRANSISTORS; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; STABILITY; THIN FILM CIRCUITS; THIN FILM TRANSISTORS; THIN FILMS; ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY; SPECTROSCOPY;

DENSITY OF TRAP STATE; GRAZING INCIDENCE X-RAY DIFFRACTION; HIGH ELECTRON MOBILITY; OPERATIONAL STABILITY; ORGANIC THIN FILM TRANSISTOR (OTFTS); ORGANIC THIN FILM TRANSISTORS; TEMPLATE EFFECTS; ULTRA-HIGH-SENSITIVITY; GRAZING INCIDENCE;

HIGH ELECTRON MOBILITY TRANSISTORS;

EID: 84906671764     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2014.07.010     Document Type: Article

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