Evidence for kinetically limited thickness dependent phase separation in organic thin film blends

Physical Review Letters

Volumn 110, Issue 18, 2013, Pages

  Banerjee, R ^a   Novak J ^a   Frank, C ^a   Lorch, C ^a   Hinderhofer, A ^a   Gerlach, A ^a   Schreiber, F ^a  

^a UNIVERSITY OF TÜBINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CO-EVAPORATIONS; DEPTH-RESOLVED; GRAZING INCIDENCE SMALL ANGLE SCATTERINGS; GRAZING INCIDENCE X-RAY DIFFRACTION; MIXING RATIOS; ORGANIC THIN FILMS; THICKNESS DEPENDENCE; X RAY REFLECTIVITY;

MOLECULES; PHASE SEPARATION; X RAY DIFFRACTION;

MIXING;

EID: 84877293529     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.185506     Document Type: Article

References (27)

1. W. Brütting and C. Adachi, Physics of Organic Semiconductors (Wiley-VCH, Weinheim, 2012), 2nd ed.
2. W. R. Salaneck, K. Seki, A. Kahn, and J.-J. Pireaux, Conjugated Polymer and Molecular Interfaces (Marcel Dekker Inc., Basel, 2001).
3. S. R. Forrest, Chem. Rev. 97, 1793 (1997). CHREAY 0009-2665 10.1021/cr941014o
4. C. Deibel and V. Dyakonov, Rep. Prog. Phys. 73, 096401 (2010). RPPHAG 0034-4885 10.1088/0034-4885/73/9/096401
5. G. Dennler, M. C. Scharber, and C. J. Brabec, Adv. Mater. 21, 1323 (2009). ADVMEW 0935-9648 10.1002/adma.200801283
6. P. Peumans, S. Uchida, and S. R. Forrest, Nature (London) 425, 158 (2003). NATUAS 0028-0836 10.1038/nature01949
7. P. Peumans, A. Yakimov, and S. R. Forrest, J. Appl. Phys. 93, 3693 (2003). JAPIAU 0021-8979 10.1063/1.1534621
8. A. Hinderhofer and F. Schreiber, ChemPhysChem 13, 628 (2012). CPCHFT 1439-4235 10.1002/cphc.201100737
9. C. Schünemann, D. Wynands, L. Wilde, M. P. Hein, S. Pfützner, C. Elschner, K.-J. Eichhorn, K. Leo, and M. Riede, Phys. Rev. B 85, 245314 (2012). PRBMDO 1098-0121 10.1103/PhysRevB.85.245314
10. H. J. Kim, J. W. Kim, H. H. Lee, B. Lee, and J.-J. Kim, Adv. Funct. Mater. 22, 4244 (2012). AFMDC6 1616-301X 10.1002/adfm.201200778
11. A. C. Dürr, F. Schreiber, K. A. Ritley, V. Kruppa, J. Krug, H. Dosch, and B. Struth, Phys. Rev. Lett. 90, 016104 (2003). PRLTAO 0031-9007 10.1103/PhysRevLett.90.016104
12. S. Kowarik, A. Gerlach, S. Sellner, F. Schreiber, L. Cavalcanti, and O. Konovalov, Phys. Rev. Lett. 96, 125504 (2006). PRLTAO 0031-9007 10.1103/PhysRevLett.96.125504
13. C. W. Tang, Appl. Phys. Lett. 48, 183 (1986). APPLAB 0003-6951 10.1063/1.96937
14. M. Zhang, H. Wang, H. Tian, Y. Geng, and C. W. Tang, Adv. Mater. 23, 4960 (2011). ADVMEW 0935-9648 10.1002/adma.201102173
15. A. Opitz, J. Wagner, W. Brütting, I. Salzmann, N. Koch, J. Manara, J. Pflaum, A. Hinderhofer, and F. Schreiber, IEEE J. Sel. Top. Quantum Electron. 16, 1707 (2010). IJSQEN 1077-260X 10.1109/JSTQE.2010.2048096
16. H. Dosch, Critical Phenomena at Surfaces and Interfaces (Springer-Verlag, Berlin, 1992).
17. A. Kitaigorodsky, Mixed Crystals (Springer, Berlin, 1984).
18. A. Aufderheide, K. Broch, J. Novák, A. Hinderhofer, R. Nervo, A. Gerlach, R. Banerjee, and F. Schreiber, Phys. Rev. Lett. 109, 156102 (2012). PRLTAO 0031-9007 10.1103/PhysRevLett.109.156102
19. J. Wagner, M. Gruber, A. Hinderhofer, A. Wilke, B. Bröker, J. Frisch, P. Amsalem, A. Vollmer, A. Opitz, N. Koch, F. Schreiber, and W. Brütting, Adv. Funct. Mater. 20, 4295 (2010); AFMDC6 1616-301X 10.1002/adfm.201001028
20. M. Gruber, Adv. Energy Mater. (in press). 10.1002/aenm.201201012
21. K. A. Ritley, B. Krause, F. Schreiber, and H. Dosch, Rev. Sci. Instrum. 72, 1453 (2001). RSINAK 0034-6748 10.1063/1.1336822
22. A. Hinderhofer, A. Gerlach, K. Broch, T. Hosokai, K. Yonezawa, K. Kato, S. Kera, N. Ueno, and F. Schreiber, J. Phys. Chem. C 117, 1053 (2013). JPCCCK 1932-7447 10.1021/jp3106056
23. L. G. Parratt, Phys. Rev. 95, 359 (1954). PHRVAO 0031-899X 10.1103/PhysRev.95.359
24. M. Tolan, X-ray Scattering from Soft-Matter Thin Films (Springer, Berlin, 1999);
25. J. Daillant and A. Gibaud, X-ray and Neutron Reflectivity: Principles and Applications (Springer, Paris, 1999).
26. M. A. Heinrich, J. Pflaum, A. K. Tripathi, W. Frey, M. L. Steigerwald, and T. Siegrist, J. Phys. Chem. C 111, 18 878 (2007). JPCCCK 1932-7447 10.1021/jp0748967
27. R. Lazzari, J. Appl. Crystallogr. 35, 406 (2002). JACGAR 0021-8898 10.1107/S0021889802006088