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Volumn 63, Issue 2, 2014, Pages 655-677

Industrial applications of computed tomography

Author keywords

Dimensional metrology; Industrial application; Quality control; X ray Computed Tomography (CT)

Indexed keywords

INDUSTRIAL APPLICATIONS; QUALITY CONTROL; SURVEYS;

EID: 84905910175     PISSN: 00078506     EISSN: 17260604     Source Type: Journal    
DOI: 10.1016/j.cirp.2014.05.011     Document Type: Article
Times cited : (524)

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