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Volumn 3, Issue , 2009, Pages 1787-1791

Assessment of measurement uncertainty caused in the preparation of measurements using computed tomography

Author keywords

Computed tomography; Manufacturing metrology; Measurement uncertainty

Indexed keywords

COMPUTED TOMOGRAPHY; MACHINE OPERATORS; MEASUREMENT DATA; MEASUREMENT RESULTS; MEASUREMENT UNCERTAINTY; MEASUREMENT UNCERTAINTY BUDGET; OPTICAL MEASUREMENT DEVICES; X-RAY COMPUTED TOMOGRAPHY;

EID: 84871568691     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (26)

References (6)
  • 2
    • 55949098581 scopus 로고    scopus 로고
    • Determination of the measurement uncertainty of computed tomography measurements using a cylinder head as an example
    • M. Bartscher, U. Hilpert, and D. Fiedler, "Determination of the Measurement Uncertainty of Computed Tomography Measurements using a Cylinder Head as an example", tm - Technisches Messen, vol. 75, no 3, pp. 178-186, 2008.
    • (2008) Tm - Technisches Messen , vol.75 , Issue.3 , pp. 178-186
    • Bartscher, M.1    Hilpert, U.2    Fiedler, D.3
  • 3
    • 84871566697 scopus 로고    scopus 로고
    • Dimensional measurement deviation of an industrial 2D CT scanner: Influence of work piece roughness
    • Salzburg, Austria, May
    • M. Bartscher, D. Fiedler and H.-C. Saewert, "Dimensional measurement deviation of an industrial 2D CT scanner: Influence of work piece roughness", DACH Tagung, Salzburg, Austria, May 2005.
    • (2005) DACH Tagung
    • Bartscher, M.1    Fiedler, D.2    Saewert, H.-C.3
  • 4
    • 4644252218 scopus 로고
    • Dimensional measurement deviation of an industrial 2D CT scanner: Influence of work piece geometry
    • VDI-Berichte Ludwigsburg, Germany, 2004
    • M. Bartscher, D. Fiedler, H.-C. Saewert and F. Wäldele, "Dimensional measurement deviation of an industrial 2D CT scanner: Influence of work piece geometry", Conference "Sensoren und Messsysteme", VDI-Berichte 1829, pp. 583-593, Ludwigsburg, Germany, 2004.
    • (1829) Conference "Sensoren und Messsysteme" , pp. 583-593
    • Bartscher, M.1    Fiedler, D.2    Saewert, H.-C.3    Wäldele, F.4
  • 5
    • 84871600875 scopus 로고    scopus 로고
    • Artefact for 3D CT measurements of electronic assemblies - Prüfkörper für die 3D-Computertomographie von elektronischen Baugruppen
    • Wels, Austria
    • A. Weckenmann, Ph. Krämer and B. Potschies, "Artefact for 3D CT measurements of electronic assemblies - Prüfkörper für die 3D-Computertomographie von elektronischen Baugruppen", Conference Industrielle Computertomografie, pp. 59-64, Wels, Austria, 2008.
    • (2008) Conference Industrielle Computertomografie , pp. 59-64
    • Weckenmann, A.1    Krämer, Ph.2    Potschies, B.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.