A new concept for high-speed atline and inline CT for up to 100% mass production process control allowing both 3D metrology and failure analysis

51st Annual Conference of the British Institute of Non-Destructive Testing 2012, NDT 2012

Volumn , Issue , 2012, Pages 251-258

  Brunke, Oliver ^a   Hansen, Ferdinand ^b   Stuke, Ingo ^c   Butz, Friedrich ^b   Jeltsch, Frank ^b  

^a GE Sensing and Inspection Technologies GmbH   (Germany)

^b VOLKSWAGEN AG   (Germany)

^c GE Inspection Technologies GmbH   (Germany)

Author keywords

3D metrology; 3D ADR; Atline CT; Automated defect recognition; Fast CT; Gantry based CT; Helix CT; Inline CT

Indexed keywords

COMPUTERIZED TOMOGRAPHY; DEFECTS; UNITS OF MEASUREMENT;

3-D METROLOGIES; 3D-ADR; DEFECT RECOGNITION; IN-LINE INSPECTIONS; MANUFACTURING PROCESS; MASS PRODUCTION PROCESS; NON DESTRUCTIVE TESTING; STATE-OF-THE-ART TECHNOLOGY;

NONDESTRUCTIVE EXAMINATION;

EID: 84906250344     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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