Modeling of transient and static components of intrinsic emission from VLSI circuits

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2014, Pages

  Shehata, Andrea Bahgat ^a   Stellari, Franco ^a   Weger, Alan ^a   Song, Peilin ^a  

^a IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

Failure Analysis; Photon Emission Microscopy (PEM); Superconducting nanowire Single Photon Detector (SnSPD); Time Resolved Emission (TRE)

Indexed keywords

FAILURE ANALYSIS; NANOWIRES; PARTICLE BEAMS; PHOTONS;

DIFFERENT OPERATING CONDITIONS; ELECTRICAL PARAMETER; INTRINSIC EMISSION; PHOTON EMISSION MICROSCOPY; SIGNAL FREQUENCIES; SINGLE-PHOTON DETECTORS; SWITCHING ACTIVITIES; TIME-RESOLVED EMISSIONS;

VLSI CIRCUITS;

EID: 84905658786     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2014.6860639     Document Type: Conference Paper

References (9)

1. F. Stellari, P. Song, J.C. Tsang, M.K. McManus, and M.B. Ketchen, "Testing and diagnostics of CMOS circuits using Light Emission from Off-State Leakage Current", IEEE Trans. on Electron Dev., vol. 51, no. 9, 2004, pp. 1455-1462.
2. S. Polonsky, M. Bhushan, A. Weger, and P. Song, "Photon emission microscopy of inter/intra chip device performance variations", ESREF, 2005, pp. 1471-1475.
3. S. Rusu et al., "Backside infrared probing for static voltage drop and dynamic timing measurements", ISSCC, 2001, pp. 276-277.
4. P. Song et al., "MARVEL-Malicious Alteration Recognitionn and Verification by Emission of Light", HOST, 2011, pp. 117-121.
5. J.C. Tsang and J.A. Kash, "Picosecond hot electron light emission from submicron complementary metal-oxide-semiconductor circuits", Applied Physics Letters, 70, 1997, pp. 889-891.
6. S. Seidel, V.R. Rao, A.N. Zaplatin, and F.J. Low, "Application of infrared emission microscope for flip-chip (C4) failure analysis", ISTFA, 1999, pp. 471-476.
7. F. Stellari, A. Tosi, and P. Song, "Switching time extraction of CMOS gates using time-resolved emission (TRE)", IRPS, 2006, pp. 566-573.
8. J.A. Kash and J.C. Tsang, "Dynamic Internal Testing of CMOS Circuits Using Hot Luminescence", IEEE Electron Dev. Let., vol. 18, no. 7, 1997, pp. 330-332.
9. R.H. Hadfield, "Single-photon detectors for optical quantum information applications", Nature Photonics, 3, 2009, pp. 696-705.