Local band gap measurements by VEELS of thin film solar cells

Microscopy and Microanalysis

Volumn 20, Issue 4, 2014, Pages 1246-1253

  Keller, Debora ^a   Buecheler, Stephan ^a   Reinhard, Patrick ^a   Pianezzi, Fabian ^a   Pohl, Darius ^b   Surrey, Alexander ^b,c   Rellinghaus, Bernd ^b   Erni, Rolf ^a   Tiwari, Ayodhya N ^a  

^a SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^b Institute for Metallic Materials   (Germany)

^c DRESDEN UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

band gap; chalcopyrite; monochromated STEM; solar cell; VEELS

Indexed keywords

COPPER; GALLIUM; INDIUM; SELENIUM;

MATERIALS TESTING; PROCEDURES; SEMICONDUCTOR; SOLAR ENERGY;

COPPER; GALLIUM; INDIUM; MATERIALS TESTING; SELENIUM; SEMICONDUCTORS; SOLAR ENERGY;

EID: 84905232573     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614000543     Document Type: Article

References (27)

1. ABOU-RAS, D., CABALLERO, R., FISCHER, C.-H., KAUFMANN, C.A., LAUERMANN, I., MAINZ, R., MÖNIG, H., SCHÖPKE, A., STEPHAN, C., STREECK, C., SCHORR, S., EICKE, A., DÖBELI, M., GADE, B., HINRICHS, J., NUNNEY, T., DIJKSTRA, H., HOFFMANN, V., KLEMM, D., EFIMOVA, V., BERGMAIER, A., DOLLINGER, G., WIRTH, T., UNGER, W., ROCKETT, A.A., PEREZ-RODRIGUEZ, A., ALVAREZ-GARCIA, J., IZQUIERDO-ROCA, V., SCHMID, T., CHOI, P.-P., MÜLLER, M., BERTRAM, F., CHRISTEN, J., KHATRI, H., COLLINS, R.W., MARSILLAC, S. & KÖTSCHAU, I. (2011). Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films. Microsc Microanal 17, 728-751.
2. AGUIAR, J.A., REED, B.W., RAMASSE, Q.M., ERNI, R. & BROWNING, N.D. (2013). Quantifying the low-energy limit and spectral resolution in valence electron energy loss spectroscopy. Ultramicroscopy 124, 130-138.
3. 2. Phys Rev B 63, 075203.
4. BANGERT, U., HARVEY, A., DAVIDSON, J., KEYSE, R. & DIEKER, C. (1998). Correlation between microstructure and localized band gap of GaN grown on SiC. J Appl Phys 83, 7726.
5. BATSON, P.E., KAVANAGH, K.L., WOODALL, J.M. & MAYER, J.W. (1986). Electron-energy-loss scattering near a single misfit dislocation at the GaAs/GaInAs interface. Phys Rev Lett 57, 2729-2732.
6. BOLTON, J.P.R. & CHEN, M. (1995). Electron energy loss in multilayered slabs. Ultramicroscopy 60, 247-263.
7. 2 solar cells grown on flexible polymer films. NatMater 10, 857-861.
8. 2 thin films for high efficiency solar cells. Nat Mater 12, 1107-1111.
9. ERNI, R. & BROWNING, N.D. (2005). Valence electron energy-loss spectroscopy in monochromated scanning transmission electron microscopy. Ultramicroscopy 104, 176-192.
10. ERNI, R. & BROWNING, N.D. (2007). Quantification of the sizedependent energy gap of individual CdSe quantum dots by valence electron energy-loss spectroscopy. Ultramicroscopy 107, 267-273.
11. ERNI, R. & BROWNING, N.D. (2008). The impact of surface and retardation losses on valence electron energy-loss spectroscopy. Ultramicroscopy 108, 84-99.
12. ERNI, R., LAZAR, S. & BROWNING, N.D. (2008). Prospects for analyzing the electronic properties in nanoscale systems by VEELS. Ultramicroscopy 108, 270-276.
13. GU, L., SROT, V., SIGLE, W., KOCH, C., VAN AKEN, P., SCHOLZ, F., THAPA, S., KIRCHNER, C., JETTER, M. & RÜHLE, M. (2007). Bandgap measurements of direct and indirect semiconductors using monochromated electrons. Phys Rev B 75, 195214.
14. 2. J Phys Chem Solids 66, 1895-1898.
15. HEGEDUS, S.S. & SHAFARMAN, W.N. (2004). Thin-film solar cells: Device measurements and analysis. Prog Photovolt 12, 155-176.
16. KIMOTO, K., KOTHLEITNER, G., GROGGER, W., MATSUI, Y. & HOFER, F. (2005). Advantages of a monochromator for bandgap measurements using electron energy-loss spectroscopy. Micron 36, 185-189.
17. KRÖGER, E. (1968). Berechnung der Energieverluste schneller Elektronen in dünnen Schichten mit Retardierung. Z Physik 216, 115-135.
18. LAZAR, S., BOTTON, G.A., WU, M.-Y., TICHELAAR, F.D. & ZANDBERGEN, H.W. (2003). Materials science applications of HREELS in near edge structure analysis and low-energy loss spectroscopy. Ultramicroscopy 96, 535-546.
19. MALIS, T., CHENG, S.C. & EGERTON, R.F. (1988). EELS log-ratio technique for specimen-thickness measurement in the TEM. J Electron Microsc Tech 8, 193-200.
20. 2-based polycrystalline materials. J Appl Phys 113, 063505-063505-14.
21. 2-based heterojunction solar cells. Part I. Transport analysis. J Appl Phys 87, 584.
22. RAFFERTY, B. & BROWN, L. (1998). Direct and indirect transitions in the region of the band gap using electron-energy-loss spectroscopy. Phys Rev B 58, 10326-10337.
23. SCHAMM, S. & ZANCHI, G. (2003). Study of the dielectric properties near the band gap by VEELS: Gap measurement in bulk materials. Ultramicroscopy 96, 559-564.
24. SPECHT, P., HO, J.C., XU, X., ARMITAGE, R., WEBER, E.R., ERNI, R. & KISIELOWSKI, C. (2005). Band transitions in wurtzite GaN and InN determined by valence electron energy loss spectroscopy. Solid State Commun 135, 340-344.
25. 3 and a σ13 boundary: Electronic structure and dispersion forces. Ultramicroscopy 86, 303-318.
26. 2 on its electronic, structural, and defect properties. Appl Phys Lett 72, 3199-3201.
27. ZHANG, L., ERNI, R., VERBEECK, J. & VAN TENDELOO, G. (2008). Retrieving the dielectric function of diamond from valence electron energy-loss spectroscopy. Phys Rev B 77, 195119.