The 100% yield explanation approach in lucent technologies Madrid

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings

Volumn 2000-January, Issue , 2000, Pages 26-32

  Recio, Miguel ^a   Merino, Miguel A ^a   Martín, Victorino ^a   Ayucar, Jose A ^a   Moreno, Julian ^a   Godino, Agustin ^a   Mata, Carlos ^a   Morilla, Carmen ^a   Lorenzo, Alfonso ^a   Fernández, Rosa ^a   Fernández, Almudena ^a   Iñarrea, Jesus ^a   Alvarez, Manuel ^a   Sacedón, Ana ^a   Mateos, Carlos ^a   Therryl, Kathy ^a   González, Gerardo ^a   Cruceta, Sergio ^a  

^a Polígono Industrial de Tres Cantos   (Spain)

Author keywords

Data analysis; Knowledge management; Manufacturing; Microelectronics; Packaging machines; Probes; Semiconductor device modeling; Software packages; Software tools; Stability

Indexed keywords

CHIP SCALE PACKAGES; COMPUTER AIDED SOFTWARE ENGINEERING; COMPUTER SOFTWARE; CONVERGENCE OF NUMERICAL METHODS; DATA REDUCTION; DEFECTS; KNOWLEDGE BASED SYSTEMS; KNOWLEDGE MANAGEMENT; MANUFACTURE; MICROELECTRONICS; PACKAGING MACHINES; PROBES; SEMICONDUCTOR DEVICE MANUFACTURE; SEMICONDUCTOR DEVICE MODELS; SEMICONDUCTOR DEVICES; SOFTWARE PACKAGES;

DEFECT SIZE; KEY TOPICS; KNOWLEDGE BASED; LUCENT TECHNOLOGIES; MANUFACTURING LINES; YIELD COMPONENTS;

ELECTRONICS PACKAGING;

EID: 84904630084     PISSN: 10788743     EISSN: None     Source Type: Journal    
DOI: 10.1109/ASMC.2000.902554     Document Type: Article

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