SmartBitTM: Bitmap to defect correlation software for yield improvement

IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings

Volumn , Issue , 2000, Pages 194-198

  Merino, Miguel A ^a   Cruceta, Sergio ^a   Garcia, Alfredo ^a   Recio, Miguel ^a  

^a NOKIA RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION THEORY; DATA STORAGE EQUIPMENT; RELIABILITY;

SOFTWARE PACKAGE SMARTBIT;

COMPUTER SOFTWARE;

EID: 0034482403     PISSN: 10788743     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)