Fast and efficient yield entitlement for 0.3 microns technology production ramp-up

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 3743, Issue , 1999, Pages 305-313

  Recio, Miguel ^a   Moreno, Julian ^a   Merino, Miguel A ^a   Ayucar, Jose A ^a   Martin, Victorino ^a   Godino, Agustin ^a  

^a Lucent Technologies Microelectronica   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; ELECTRIC NETWORK ANALYSIS; FAILURE ANALYSIS; INTEGRATED CIRCUIT LAYOUT; MICROPROCESSOR CHIPS; PERFORMANCE; YIELD STRESS;

YIELD ANALYSIS; YIELD ENTITLEMENT;

INTEGRATED CIRCUIT MANUFACTURE;

EID: 0032632803     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Article

References (9)