Effects of sol concentration on structural, morphological and optical waveguiding properties of sol-gel ZnO nanostructured thin films

EPJ Applied Physics

Volumn 67, Issue 1, 2014, Pages

  Tazerout, Mohand ^a   Chelouche, Azeddine ^a   Touam, Tahar ^b   Djouadi, Djamel ^a   Boudjouan, Fares ^a   Khodja, Sebti ^b   Ouhenia, Salim ^a   Fischer, Alexis ^c   Boudrioua, Azzedine ^c  

^a UNIVERSITY OF BEJAIA   (Algeria)

^b BADJI MOKHTAR UNIVERSITY   (Algeria)

^c Centrale de Proximité en Nanotechnologies de Paris Nord   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; METALLIC FILMS; OPTICAL FILMS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SOL-GELS; SUBSTRATES; SURFACE ROUGHNESS; THIN FILMS; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

ATTENUATION COEFFICIENT; DIFFERENT PRECURSORS; HEXAGONAL STRUCTURES; NANOSTRUCTURED THIN FILM; SOL-GEL DIP COATING TECHNIQUE; SOLUTION CONCENTRATION; UV-VISIBLE SPECTROPHOTOMETER; WAVEGUIDING PROPERTIES;

WAVEGUIDES;

EID: 84904294150     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2014140109     Document Type: Article

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