Nanocrystalline ZnO thin films by spin coating-pyrolysis method

Journal of Alloys and Compounds

Volumn 491, Issue 1-2, 2010, Pages 308-313

  Sahoo, Trilochan ^a   Kim, Myoung ^a   Lee, Mi Hee ^a   Jang, Lee Woon ^a   Jeon, Ju Won ^a   Kwak, Joon Seop ^b   Ko, In Yong ^a   Lee, In Hwan ^a  

^a Chonbuk National University   (South Korea)

^b Sunchon National University   (South Korea)

Author keywords

Luminescence; Sol gel; Spin coating; Thin film; X ray diffraction; Zinc oxide

Indexed keywords

DEEP LEVEL EMISSION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FTIR ANALYSIS; HIGHER TEMPERATURES; MATERIAL QUALITY; MOLAR CONCENTRATION; MORPHOLOGY ANALYSIS; NANOCRYSTALLINE ZNO; NON-POLAR; PHASE EVOLUTIONS; POLAR SOLVENTS; POLYCRYSTALLINE THIN FILM; PRECURSOR CONCENTRATION; SI(1 0 0); SOL-GEL SPIN COATING; STRUCTURE AND MORPHOLOGY; THIN FILM X-RAY DIFFRACTIONS; UV LUMINESCENCE; ZINC OXIDE THIN FILMS; ZNO THIN FILM;

COATINGS; CRYSTAL ORIENTATION; DIFFRACTION; FIELD EMISSION; FIELD EMISSION MICROSCOPES; FOURIER TRANSFORM INFRARED SPECTROSCOPY; GELS; LIGHT; LUMINESCENCE; METALLIC FILMS; MORPHOLOGY; OPTICAL FILMS; OPTICAL PROPERTIES; PHOTOLUMINESCENCE SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SOLS; SPIN COATING; SPIN DYNAMICS; THIN FILM DEVICES; THIN FILMS; VAPOR DEPOSITION; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC; ZINC COATINGS; ZINC OXIDE;

OXIDE FILMS;

EID: 74449091641     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.10.153     Document Type: Article

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