Quantifying aluminum and semiconductor industry perfluorocarbon emissions from atmospheric measurements

Geophysical Research Letters

Volumn 41, Issue 13, 2014, Pages 4787-4794

  Kim, Jooil ^a,b   Fraser, Paul J ^c   Li, Shanlan ^a,d   Mühle, Jens ^b   Ganesan, Anita L ^e   Krummel, Paul B ^c   Steele, L Paul ^c   Park, Sunyoung ^d   Kim, Seung Kyu ^f   Park, Mi Kyung ^a   Arnold, Tim ^b   Harth, Christina M ^b   Salameh, Peter K ^b   Prinn, Ronald G ^e   Weiss, Ray F ^b   Kim, Kyung Ryul ^a,g  

^a Seoul National University   (South Korea)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c Bureau of Meteorology Centre for Australian Weather and Climate Research   (Australia)

^d Kyungpook National University   (South Korea)

^e MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^f SolarLight Ltd   (South Korea)

^g Gwangju Institute of Science and Technology (GIST)   (South Korea)

Author keywords

aluminum production; emissions; greenhouse gases; perfluorocarbons; semiconductor manufacture

Indexed keywords

ALUMINUM; ALUMINUM PLANTS; GREENHOUSE GASES; PARTICULATE EMISSIONS; SEMICONDUCTOR DEVICE MANUFACTURE;

ALUMINUM PRODUCTION; ATMOSPHERIC MEASUREMENT; EMISSION INVENTORIES; IN-SITU MEASUREMENT; PERFLUOROCARBON EMISSIONS; PERFLUOROCARBONS; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR MANUFACTURES;

AIR POLLUTION;

EID: 84903869883     PISSN: 00948276     EISSN: 19448007     Source Type: Journal    
DOI: 10.1002/2014GL059783     Document Type: Article

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