Determination of energy level alignment at metal/molecule interfaces by in-device electrical spectroscopy

Nature Communications

Volumn 5, Issue , 2014, Pages

  Gobbi, M ^a,b   Pietrobon, L ^a   Atxabal, A ^a   Bedoya Pinto, A ^a   Sun, X ^a   Golmar, F ^a,c   Llopis, R ^a   Casanova, F ^a,d   Hueso, L E ^a,d  

^a CIC NANOGUNE   (Spain)

^b UNIVERSITÉ DE STRASBOURG   (France)

^c Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

METAL;

ENERGY EFFICIENCY; EXPERIMENTAL STUDY; LOW TEMPERATURE; METAL; MOLECULAR ANALYSIS; SPECTROSCOPY;

ARTICLE; ELECTRIC RESISTANCE; ELECTRON; ENERGY; MEASUREMENT; MOLECULE; SEMICONDUCTOR; SPECTROSCOPY;

EID: 84903213429     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms5161     Document Type: Article

References (34)

1. Hwang, J., Wan, A. & Kahn, A. Energetics of metal-organic interfaces: new experiments and assessment of the field. Mater. Sci. Eng. R Rep. 64, 1-31 (2009).
2. Braun, S., Salaneck, W. R. & Fahlman, M. Energy-level alignment at organic/metal and organic/organic interfaces. Adv. Mater. 21, 1450-1472 (2009).
3. Friend, R. H. et al. Electroluminescence in conjugated poymers. Nature 397, 121-128 (1999).
4. Sirringhaus, H. Device physics of solution-processed organic field-effect transistors. Adv. Mater. 17, 2411-2425 (2005). (Pubitemid 41504967)
5. Lo, M. F. et al. Limits of open circuit voltage in organic photovoltaic devices. Appl. Phys. Lett. 96, 113303 (2010).
6. Pfeiffer, M., Leo, K. & Karl, N. Fermi level determination in organic thin films by the Kelvin probe method. J. Appl. Phys. 80, 6880 (1996).
7. Ohno, T. R. et al. C60 bonding and energy-level alignment on metal and semiconductor surfaces. Phys. Rev. B 44, 13747-13755 (1991).
8. Chase, S. J., Bacsa, W. S., Mitch, M. G., Pilione, L. J. & Lannin, J. S. Surface-enhanced Raman scattering and photoemission of C60 on noble-metal surfaces. Phys. Rev. B 46, 7873-7877 (1992).
9. Tsuei, K.-D. et al. Photoemission and photoabsorption study of C60 adsorption on Cu(111) surfaces. Phys. Rev. B 56, 15412-15420 (1997). (Pubitemid 127484599)
10. Maxwell, A. J. et al. Electronic and geometric structure of C60 on Al(111) and A (110). Phys. Rev. B 57, 7312-7326 (1998). (Pubitemid 128492011)
11. Pedio, M. et al. C60/metal surfaces: adsorption and decomposition. Surf. Sci. 437, 249-260 (1999).
12. Hayashi, N., Ishii, H., Ouchi, Y. & Seki, K. Examination of band bending at buckminsterfullerene (C[sub 60])/metal interfaces by the Kelvin probe method. J. Appl. Phys. 92, 3784 (2002). (Pubitemid 35209156)
13. Osikowicz, W., de Jong, M. P. & Salaneck, W. R. Formation of the interfacial dipole at organic-organic interfaces: C60/polymer interfaces. Adv. Mater. 19, 4213-4217 (2007). (Pubitemid 350254799)
14. Kaiser, W. J. & Bell, L. D. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy. Phys. Rev. Lett. 60, 1406 (1988).
15. Bell, L. D. & Kaiser, W. J. Observation of interface band structure by ballistic-electron-emission microscopy. Phys. Rev. Lett. 61, 2368-2371 (1988).
16. Troadec, C., Kunardi, L. & Chandrasekhar, N. Ballistic emission spectroscopy and imaging of a buried metal/organic interface. Appl. Phys. Lett. 86, 072101 (2005).
17. Li, W. et al. Ballistic electron emission microscopy studies of Au/molecule/n-GaAs diodes. J. Phys. Chem. B 109, 6252-6256 (2005). (Pubitemid 40496837)
18. Peumans, P., Yakimov, A. & Forrest, S. R. Small molecular weight organic thin-film photodetectors and solar cells. J. Appl. Phys. 93, 3693 (2003).
19. Ventrice, C., LaBella, V., Ramaswamy, G., Yu, H. & Schowalter, L. Measurement of hot-electron scattering processes at Au/Si(100) Schottky interfaces by temperature-dependent ballistic-electron-emission microscopy. Phys. Rev. B. Condens. Matter 53, 3952-3959 (1996).
20. Jansen, R. The spin-valve transistor: a review and outlook. J. Phys. D: Appl. Phys. 36, R289-R308 (2003).
21. Appelbaum, I., Huang, B. & Monsma, D. J. Electronic measurement and control of spin transport in silicon. Nature 447, 295-298 (2007). (Pubitemid 46788838)
22. Henderson, G. N., First, P. N., Gaylord, T. K. & Glytsis, E. N. Quantum transmittance from low-temperature ballistic electron emission spectroscopy of Au/Si(100) Schottky interfaces. Phys. Rev. Lett. 71, 2999 (1993).
23. Gobbi, M. et al. C60-based hot-electron magnetic tunnel transistor. Appl. Phys. Lett. 101, 102404 (2012).
24. Baldo, M. & Forrest, S. Interface-limited injection in amorphous organic semiconductors. Phys. Rev. B 64, 085201 (2001).
25. Coropceanu, V. et al. Charge transport in organic semiconductors. Chem. Rev. 107, 926-952 (2007). (Pubitemid 46736532)
26. Jiang, J., Pearson, J. & Bader, S. Direct determination of energy level alignment and charge transport at metal-Alq3 interfaces via ballistic-electron-emission spectroscopy. Phys. Rev. Lett. 106, 156807 (2011).
27. Sakanoue, T. & Sirringhaus, H. Band-like temperature dependence of mobility in a solution-processed organic semiconductor. Nat. Mater. 9, 736-740 (2010).
28. Ma, L., Ouyang, J. & Yang, Y. High-speed and high-current density C60 diodes. Appl. Phys. Lett. 84, 4786 (2004).
29. Crispin, X. et al. Characterization of the interface dipole at organic/metal interfaces. J. Am. Chem. Soc. 124, 8131-8141 (2002). (Pubitemid 34755532)
30. Osikowicz, W. et al. Energetics at Au top and bottom contacts on conjugated polymers. Appl. Phys. Lett. 88, 193504 (2006).
31. Wan, A., Hwang, J., Amy, F. & Kahn, A. Impact of electrode contamination on the a-NPD/Au hole injection barrier. Org. Electron. 6, 47-54 (2005). (Pubitemid 40537232)
32. Parr, R. G. & Pearson, R. G. Absolute hardness: companion parameter to absolute electronegativity. J. Am. Chem. Soc. 105, 7512-7516 (1983).
33. Jang, H. & Appelbaum, I. Spin polarized electron transport near the Si/SiO2 interface. Phys. Rev. Lett. 103, 117202 (2009).
34. Banerjee, T., Haq, E., Siekman, M., Lodder, J. & Jansen, R. Spin filtering of hot holes in a metallic ferromagnet. Phys. Rev. Lett. 94, 027204 (2005).