Evaluation of disturbing effect of mesh holes in wide-acceptance-angle electrostatic mesh lenses

Journal of Electron Spectroscopy and Related Phenomena

Volumn 195, Issue , 2014, Pages 78-84

  Matsuda, Hiroyuki ^a   Tóth, László ^b   Matsui, Fumihiko ^a   Daimon, Hiroshi ^a  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b UNIVERSITY OF DEBRECEN   (Hungary)

Author keywords

2D photoelectron spectroscopy; Davisson Calbick formula; Mesh lens; Mesh hole effect; Wide acceptance angle

Indexed keywords

ELECTROSTATICS; X RAY PHOTOELECTRON SPECTROSCOPY; ANGULAR DISTRIBUTION; ELECTROSTATIC LENSES; PHOTOELECTRONS; PHOTONS;

ACCEPTANCE ANGLE; ANGLE OF INCIDENCE; DAVISSON-CALBICK FORMULA; MESH-HOLE EFFECT; ORTHOGONAL DIRECTIONS; PHOTOELECTRON ANGULAR DISTRIBUTIONS; PHOTOELECTRON INTENSITIES; SPHERICAL ABERRATION CORRECTION; MESH HOLE;

ELECTROSTATIC LENSES; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84902302558     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2014.05.013     Document Type: Article

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