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Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 75, Issue 4, 2007, Pages

Approach for simultaneous measurement of two-dimensional angular distribution of charged particles. III. Fine focusing of wide-angle beams in multiple lens systems

(4) Matsuda, Hiroyuki a Daimon, Hiroshi a Tóth, László a Matsui, Fumihiko a

a NONE

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ANGULAR DISTRIBUTION; ELECTROSTATIC LENSES; PARTICLE BEAMS; PROBLEM SOLVING; RAY TRACING; TWO DIMENSIONAL;

CHARGED-PARTICLE BEAMS; DIVERGENCE ANGLES; SPHERICAL ABERRATION; WIDE-ANGLE CHARGED-PARTICLE BEAMS;

CHARGED PARTICLES;

EID: 34247359128 PISSN: 15393755 EISSN: 15502376 Source Type: Journal
DOI: 10.1103/PhysRevE.75.046402 Document Type: Article

Times cited : (26)

References (25)

1
- 27944458921
- PLEEE8 1063-651X 10.1103/PhysRevE.71.066503
- H. Matsuda, H. Daimon, M. Kato, and M. Kudo, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.71.066503 71, 066503 (2005).
- (2005) Phys. Rev. e , vol.71 , pp. 066503
- Matsuda, H.¹ Daimon, H.² Kato, M.³ Kudo, M.⁴

2
- 33748449490
- PLEEE8 1063-651X 10.1103/PhysRevE.74.036501
- H. Matsuda and H. Daimon, Phys. Rev. E PLEEE8 1063-651X 10.1103/PhysRevE.74.036501 74, 036501 (2006).
- (2006) Phys. Rev. e , vol.74 , pp. 036501
- Matsuda, H.¹ Daimon, H.²

3
- 0001160818
- OTIKAJ 0030-4026
- O. Scherzer, Optik (Stuttgart) OTIKAJ 0030-4026 2, 114 (1947).
- (1947) Optik (Stuttgart) , vol.2 , pp. 114
- Scherzer, O.¹

4
- 0020834203
- JVTBD9 0734-211X 10.1116/1.582736
- A. A. van Gorkum, J. Vac. Sci. Technol. B JVTBD9 0734-211X 10.1116/1.582736 1, 1312 (1983).
- (1983) J. Vac. Sci. Technol. B , vol.1 , pp. 1312
- Van Gorkum, A.A.¹

5
- 21844505384
- JVTAD6 0734-2101 10.1116/1.579504
- M. Kato and T. Sekine, J. Vac. Sci. Technol. A JVTAD6 0734-2101 10.1116/1.579504 13, 2255 (1995).
- (1995) J. Vac. Sci. Technol. A , vol.13 , pp. 2255
- Kato, M.¹ Sekine, T.²

6
- 0035280939
- PRLTAO 0031-9007 10.1103/PhysRevLett.86.2034
- H. Daimon, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.86.2034 86, 2034 (2001).
- (2001) Phys. Rev. Lett. , vol.86 , pp. 2034
- Daimon, H.¹

7
- 0001765453
- RSINAK 0034-6748 10.1063/1.1139884
- H. Daimon, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1139884 59, 545 (1988).
- (1988) Rev. Sci. Instrum. , vol.59 , pp. 545
- Daimon, H.¹

8
- 0348123874
- RSINAK 0034-6748 10.1063/1.1141923
- H. Daimon and S. Ino, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1141923 61, 57 (1990).
- (1990) Rev. Sci. Instrum. , vol.61 , pp. 57
- Daimon, H.¹ Ino, S.²

9
- 0000794665
- RSINAK 0034-6748 10.1063/1.1144373
- H. Nishimoto, H. Daimon, S. Suga, Y. Tezuka, S. Ino, I. Kato, F. Zenitani, and H. Soezima, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1144373 64, 2857 (1993).
- (1993) Rev. Sci. Instrum. , vol.64 , pp. 2857
- Nishimoto, H.¹ Daimon, H.² Suga, S.³ Tezuka, Y.⁴ Ino, S.⁵ Kato, I.⁶ Zenitani, F.⁷ Soezima, H.⁸

10
- 0141428856
- JAPNDE 0021-4922 10.1143/JJAP.42.4752
- T. Nohno, F. Matsui, Y. Hamada, H. Matsumoto, S. Takeda, K. Hattori, and H. Daimon, Jpn. J. Appl. Phys., Part 1 JAPNDE 0021-4922 10.1143/JJAP.42.4752 42, 4752 (2003).
- (2003) Jpn. J. Appl. Phys., Part 1 , vol.42 , pp. 4752
- Nohno, T.¹ Matsui, F.² Hamada, Y.³ Matsumoto, H.⁴ Takeda, S.⁵ Hattori, K.⁶ Daimon, H.⁷

11
- 79957954088
- APPLAB 0003-6951 10.1063/1.1511818
- F. Matsui, Y. Hori, H. Miyata, N. Suganuma, H. Daimon, H. Totsuka, K. Ogawa, T. Furukubo, and H. Namba, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1511818 81, 2556 (2002).
- (2002) Appl. Phys. Lett. , vol.81 , pp. 2556
- Matsui, F.¹ Hori, Y.² Miyata, H.³ Suganuma, N.⁴ Daimon, H.⁵ Totsuka, H.⁶ Ogawa, K.⁷ Furukubo, T.⁸ Namba, H.⁹

12
- 9744234382
- APPLAB 0003-6951 10.1063/1.1810214
- F. Matsui, H. Daimon, F. Z. Guo, and T. Matsushita, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1810214 85, 3737 (2004).
- (2004) Appl. Phys. Lett. , vol.85 , pp. 3737
- Matsui, F.¹ Daimon, H.² Guo, F.Z.³ Matsushita, T.⁴

13
- 29844434187
- PRBMDO 0163-1829 10.1103/PhysRevB.72.195417
- F. Matsui, H. Miyata, O. Rader, Y. Hamada, Y. Nakamura, K. Nakanishi, K. Ogawa, H. Namba, and H. Daimon, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.72.195417 72, 195417 (2005).
- (2005) Phys. Rev. B , vol.72 , pp. 195417
- Matsui, F.¹ Miyata, H.² Rader, O.³ Hamada, Y.⁴ Nakamura, Y.⁵ Nakanishi, K.⁶ Ogawa, K.⁷ Namba, H.⁸ Daimon, H.⁹

14
- 31644440588
- JAPIAU 0021-8979 10.1063/1.2163995
- F. Z. Guo, T. Matsushita, K. Kobayashi, F. Matsui, Y. Kato, H. Daimon, M. Koyano, Y. Yamamura, T. Tsuji, and Y. Saitoh, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.2163995 99, 024907 (2006).
- (2006) J. Appl. Phys. , vol.99 , pp. 024907
- Guo, F.Z.¹ Matsushita, T.² Kobayashi, K.³ Matsui, F.⁴ Kato, Y.⁵ Daimon, H.⁶ Koyano, M.⁷ Yamamura, Y.⁸ Tsuji, T.⁹ Saitoh, Y.¹⁰

15
- 33751215522
- STAMCV 1468-6996
- Y. Kato, F. Matsui, T. Shimizu, T. Matsushita, F. Z. Guo, T. Tsuno, and H. Daimon, Sci. Technol. Adv. Mater. STAMCV 1468-6996 7, S45 (2006).
- (2006) Sci. Technol. Adv. Mater. , vol.7 , pp. 45
- Kato, Y.¹ Matsui, F.² Shimizu, T.³ Matsushita, T.⁴ Guo, F.Z.⁵ Tsuno, T.⁶ Daimon, H.⁷

16
- 33748423713
- PSSFBP 0079-6816
- H. Daimon and F. Matsui, Prog. Surf. Sci. PSSFBP 0079-6816 81, 367 (2006).
- (2006) Prog. Surf. Sci. , vol.81 , pp. 367
- Daimon, H.¹ Matsui, F.²

17
- 0042377613
- APPLAB 0003-6951 10.1063/1.1595714
- K. Kobayashi, M. Yabashi, Y. Takata, T. Tokushima, S. Shin, K. Tamasaku, D. Miwa, T. Ishikawa, H. Nohira, T. Hattori, Y. Sugita, O. Nakatsuka, A. Sakai, and S. Zaima, Appl. Phys. Lett. APPLAB 0003-6951 10.1063/1.1595714 83, 1005 (2003).
- (2003) Appl. Phys. Lett. , vol.83 , pp. 1005
- Kobayashi, K.¹ Yabashi, M.² Takata, Y.³ Tokushima, T.⁴ Shin, S.⁵ Tamasaku, K.⁶ Miwa, D.⁷ Ishikawa, T.⁸ Nohira, H.⁹ Hattori, T.¹⁰ Sugita, Y.¹¹ Nakatsuka, O.¹² Sakai, A.¹³ Zaima, S.¹⁴

18
- 11244299520
- JESRAW 0368-2048 10.1016/j.elspec.2004.10.008
- G. Beamson, S. R. Haines, N. Moslemzadeh, P. Tsakiropoulos, J. F. Watts, P. Weightman, and K. Williams, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 10.1016/j.elspec.2004.10.008 142, 151 (2005).
- (2005) J. Electron Spectrosc. Relat. Phenom. , vol.142 , pp. 151
- Beamson, G.¹ Haines, S.R.² Moslemzadeh, N.³ Tsakiropoulos, P.⁴ Watts, J.F.⁵ Weightman, P.⁶ Williams, K.⁷

19
- 0035366083
- SUSCAS 0039-6028 10.1016/S0039-6028(01)00835-4
- M. Merkel, M. Escher, J. Settemeyer, D. Funnemann, A. Oelsner, Ch. Ziethen, O. Schmidt, M. Klais, and G. Schönhense, Surf. Sci. SUSCAS 0039-6028 10.1016/S0039-6028(01)00835-4 480, 196 (2001).
- (2001) Surf. Sci. , vol.480 , pp. 196
- Merkel, M.¹ Escher, M.² Settemeyer, J.³ Funnemann, D.⁴ Oelsner, A.⁵ Ziethen, Ch.⁶ Schmidt, O.⁷ Klais, M.⁸ Schönhense, G.⁹

20
- 22144462839
- JCOMEL 0953-8984 10.1088/0953-8984/17/16/004
- M. Escher, N. Weber, M. Merkel, C. Ziethen, P. Bernhard, G. Schönhense, S. Schmidt, F. Forster, F. Reinert, B. Krömker, and D. Funnemann, J. Phys.: Condens. Matter JCOMEL 0953-8984 10.1088/0953-8984/17/16/ 004 17, S1329 (2005).
- (2005) J. Phys.: Condens. Matter , vol.17 , pp. 1329
- Escher, M.¹ Weber, N.² Merkel, M.³ Ziethen, C.⁴ Bernhard, P.⁵ Schönhense, G.⁶ Schmidt, S.⁷ Forster, F.⁸ Reinert, F.⁹ Krömker, B.¹⁰ Funnemann, D.¹¹

21
- 20244369269
- JESRAW 0368-2048
- M. Escher, N. Weber, M. Merkel, B. Krömker, D. Funnemann, S. Schmidt, F. Reinert, F. Forster, S. Hüfner, P. Bernhard, Ch. Ziethen, H. J. Elmers, and G. Schönhense, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 144-147, 1179 (2005).
- (2005) J. Electron Spectrosc. Relat. Phenom. , vol.144-147 , pp. 1179
- Escher, M.¹ Weber, N.² Merkel, M.³ Krömker, B.⁴ Funnemann, D.⁵ Schmidt, S.⁶ Reinert, F.⁷ Forster, F.⁸ Hüfner, S.⁹ Bernhard, P.¹⁰ Ziethen, Ch.¹¹ Elmers, H.J.¹² Schönhense, G.¹³

22
- 0005628509
- JAPIAU 0021-8979 10.1063/1.345212
- G. F. Rempfer, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.345212 67, 6027 (1990).
- (1990) J. Appl. Phys. , vol.67 , pp. 6027
- Rempfer, G.F.¹

23
- 0343671049
- RSINAK 0034-6748 10.1063/1.1141216
- Z. Shao and X. D. Wu, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.1141216 61, 1230 (1990).
- (1990) Rev. Sci. Instrum. , vol.61 , pp. 1230
- Shao, Z.¹ Wu, X.D.²

24
- 0000573107
- JESRAW 0368-2048 10.1016/S0368-2048(97)00016-9
- R. Fink, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 10.1016/S0368-2048(97)00016-9 84, 231 (1997).
- (1997) J. Electron Spectrosc. Relat. Phenom. , vol.84 , pp. 231
- Fink, R.¹

25
- 1042292723
- NIMAER 0168-9002
- W. Wan, J. Feng, H. A. Padmore, and D. S. Robin, Nucl. Instrum. Methods Phys. Res. A NIMAER 0168-9002 519, 222 (2004).
- (2004) Nucl. Instrum. Methods Phys. Res. A , vol.519 , pp. 222
- Wan, W.¹ Feng, J.² Padmore, H.A.³ Robin, D.S.⁴

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