Approach for simultaneous measurement of two-dimensional angular distribution of charged particles: Spherical aberration correction using an ellipsoidal mesh

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 71, Issue 6, 2005, Pages

  Matsuda, H ^a,b   Daimon, H ^a,b   Kato, M ^c   Kudo, M ^c  

^a NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c JEOL LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATIONS; ELECTROSTATIC LENSES; RAY TRACING;

ANALYTICAL APPROXIMATION; ANGULAR DISTRIBUTION; SPHERICAL MESH;

CHARGED PARTICLES;

EID: 27944458921     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.71.066503     Document Type: Article

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