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Volumn 4, Issue 3, 2014, Pages 83-87

Mechanical annealing of Cu-Si nanowires during high-cycle fatigue

Author keywords

[No Author keywords available]

Indexed keywords

COPPER COMPOUNDS; FATIGUE OF MATERIALS; GRAIN GROWTH; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOWIRES; TENSILE STRENGTH; TENSILE TESTING; TRANSMISSION ELECTRON MICROSCOPY;

EID: 84902051323     PISSN: 21596859     EISSN: 21596867     Source Type: Journal    
DOI: 10.1557/mrc.2014.18     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.