The growth of ultra-thin zirconia films onPd3Zr(0 0 0 1)

Journal of Physics Condensed Matter

Volumn 26, Issue 22, 2014, Pages

  Choi, J I J ^a   Mayr Schmolzer W ^a,b   Mittendorfer, F ^a,b   Redinger, J ^a,b   Diebold, U ^a   Schmid, M ^a  

^a VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

^b CENTER FOR COMPUTATIONAL MATERIALS SCIENCE   (Austria)

Author keywords

alloys; oxidation; oxide surfaces; scanning tunneling microscopy; zirconia

Indexed keywords

ALLOYING; AUGER ELECTRON SPECTROSCOPY; DENSITY FUNCTIONAL THEORY; FILM PREPARATION; MICROELECTRONICS; OXIDATION; OXIDE FILMS; OXYGEN; PHOTOELECTRONS; SCANNING TUNNELING MICROSCOPY; SUBSTRATES; X RAY PHOTOELECTRON SPECTROSCOPY; ZIRCONIA; ZIRCONIUM;

AUGER ELECTRON SPECTROSCOPIES (AES); FUEL CELL TECHNOLOGIES; IN-PLANE LATTICE PARAMETERS; OXIDE SURFACE; ROTATIONAL ORIENTATION; STRUCTURE AND PHYSICAL PROPERTIES; SUBSTRATE LAYERS; ULTRATHIN ZIRCONIA FILMS;

SULFUR COMPOUNDS;

METAL NANOPARTICLE; PALLADIUM; ZIRCONIUM; ZIRCONIUM OXIDE;

CHEMICAL MODEL; CHEMICAL STRUCTURE; CHEMISTRY; COMPUTER SIMULATION; CRYSTALLIZATION; MATERIALS TESTING; PARTICLE SIZE; PROCEDURES; ULTRASTRUCTURE;

COMPUTER SIMULATION; CRYSTALLIZATION; MATERIALS TESTING; METAL NANOPARTICLES; MODELS, CHEMICAL; MODELS, MOLECULAR; PALLADIUM; PARTICLE SIZE; ZIRCONIUM;

EID: 84900812852     PISSN: 09538984     EISSN: 1361648X     Source Type: Journal    
DOI: 10.1088/0953-8984/26/22/225003     Document Type: Article

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