Correction for piezoelectric creep in scanning probe microscopy images using polynomial mapping

Scanning

Volumn 25, Issue 1, 2003, Pages 25-33

  Trawick, Matthew L ^a   Megens, Mischa ^a   Harrison, Christopher ^c   Angelescu, Dan E ^a   Vega, Daniel A ^b   Chaikin, Paul M ^a,b   Register, Richard A ^b   Adamson, Douglas H ^b  

^a PRINCETON UNIVERSITY   (United States)

^b Princeton University   (United States)

^c NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Distortion; Image processing; Piezoelectric creep; Polynomial mapping; Scanning probe microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; BLOCK COPOLYMERS; CREEP; PIEZOELECTRICITY; POLYNOMIALS; REGRESSION ANALYSIS; SCANNING;

PIEZOELECTRIC CREEP;

IMAGE ANALYSIS;

ARTICLE; IMAGE PROCESSING; IMAGE QUALITY; MATHEMATICAL ANALYSIS; PIEZOELECTRICITY; PRIORITY JOURNAL; REGRESSION ANALYSIS; SCANNING PROBE MICROSCOPY;

EID: 0037281642     PISSN: 01610457     EISSN: None     Source Type: Journal    
DOI: 10.1002/sca.4950250106     Document Type: Article

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