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Volumn 104, Issue 16, 2014, Pages

Voltage induced local hysteretic phase switching in silicon

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLOGRAPHY; FERROELECTRIC MATERIALS; HYSTERESIS; PIEZOELECTRICITY; SCANNING PROBE MICROSCOPY; SILICON;

EID: 84900317507     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4873386     Document Type: Article
Times cited : (46)

References (30)
  • 4
    • 80755187519 scopus 로고    scopus 로고
    • 10.1088/0022-3727/44/46/464003
    • E. Soergel, J. Phys. D: Appl. Phys. 44, 464003 (2011). 10.1088/0022-3727/44/46/464003
    • (2011) J. Phys. D: Appl. Phys. , vol.44 , pp. 464003
    • Soergel, E.1
  • 18
    • 84900324288 scopus 로고    scopus 로고
    • See supplementary material at http://dx.doi.org/10.1063/1.4873386 E-APPLAB-104-056417 for information about the relaxation dynamics, PFM measurement on PCB, substrate effects,PFM measurements at different humidity levels at different points and phase switching in time-domain.
  • 26
    • 84900327623 scopus 로고    scopus 로고
    • R. Proksch, e-print arXiv:1312.6933
    • R. Proksch, e-print arXiv:1312.6933.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.