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Volumn 32, Issue 3, 2014, Pages

Single-crystalline silver film grown on Si (100) substrate by using electron-gun evaporation and thermal treatment

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; DAMPING; PLASMONS; RAPID THERMAL ANNEALING; SILICON; SURFACE ROUGHNESS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 84899755561     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.4874618     Document Type: Article
Times cited : (11)

References (29)
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    • Lu, Y.-J.1
  • 7
    • 67649243471 scopus 로고    scopus 로고
    • 10.1364/OE.17.011107
    • M. T. Hill et al., Opt. Express 17, 11107 (2009). 10.1364/OE.17.011107
    • (2009) Opt. Express , vol.17 , pp. 11107
    • Hill, M.T.1
  • 8
    • 78149364215 scopus 로고    scopus 로고
    • 10.1364/JOSAB.27.000B36
    • M. T. Hill, J. Opt. Soc. Am. B 27, B36 (2010). 10.1364/JOSAB.27.000B36
    • (2010) J. Opt. Soc. Am. B , vol.27
    • Hill, M.T.1
  • 16
    • 17644419669 scopus 로고    scopus 로고
    • 10.1126/science.1108759
    • N. Fang, H. Lee, C. Sun, and X. Zhang, Science 308, 534 (2005). 10.1126/science.1108759
    • (2005) Science , vol.308 , pp. 534
    • Fang, N.1    Lee, H.2    Sun, C.3    Zhang, X.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.