Two-dimensional imaging by far-field superlens at visible wavelengths

Nano Letters

Volumn 7, Issue 11, 2007, Pages 3360-3365

  Xiong, Yi ^a   Liu, Zhaowei ^a   Sun, Cheng ^a   Zhang, Xiang ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FAR-FIELD SUPERLENS; NANOIMAGING; SUBWAVELENGTH GRATING;

DIFFRACTION GRATINGS; IMAGE RECONSTRUCTION; IMAGING SYSTEMS; NANOSENSORS; TWO DIMENSIONAL; WAVELENGTH;

OPTICAL INSTRUMENT LENSES;

METAL; NANOPARTICLE;

ALGORITHM; ARTICLE; CHEMISTRY; COMPUTER ASSISTED DIAGNOSIS; ELECTROCHEMISTRY; IMAGE PROCESSING; INSTRUMENTATION; METHODOLOGY; MICROSCOPY; NANOTECHNOLOGY; OPTICS; THEORETICAL MODEL;

ALGORITHMS; ELECTROCHEMISTRY; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGE PROCESSING, COMPUTER-ASSISTED; METALS; MICROSCOPY; MODELS, THEORETICAL; NANOPARTICLES; NANOTECHNOLOGY; OPTICS;

EID: 36749002687     PISSN: 15306984     EISSN: None     Source Type: Journal    
DOI: 10.1021/nl0716449     Document Type: Article

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