Lasing in metal-insulator-metal sub-wavelength plasmonic waveguides

Optics Express

Volumn 17, Issue 13, 2009, Pages 11107-11112

  Hill, Martin T ^a   Marell, Milan ^a   Leong, Eunice S P ^b   Smalbrugge, Barry ^a   Zhu, Youcai ^a   Sun, Minghua ^b   Van Veldhoven, Peter J ^a   Geluk, Erik Jan ^a   Karouta, Fouad ^a   Oei, Yok Siang ^a   Nötzel, Richard ^a   Ning, Cun Zheng ^b   Smit, Meint K ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b Arizona State University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; ELECTRIC LOSSES; METAL INSULATOR BOUNDARIES; METALS; OPTICAL WAVEGUIDES; PLASMONS; SEMICONDUCTOR INSULATOR BOUNDARIES; WAVEGUIDES;

DIFFRACTION LIMITS; ELECTRICALLY PUMPED; METAL INSULATOR METALS; PLASMONIC WAVEGUIDES; ROOM TEMPERATURE LASING; SUB-WAVELENGTH; TRANSVERSE ELECTRIC MODES; TRANSVERSE MAGNETIC;

MIM DEVICES;

METAL;

ARTICLE; CHEMISTRY; EQUIPMENT DESIGN; LASER; LIGHT; METHODOLOGY; OPTICS; REFRACTOMETRY; REPRODUCIBILITY; SEMICONDUCTOR; TEMPERATURE; X RAY DIFFRACTION;

EQUIPMENT DESIGN; LASERS; LIGHT; METALS; OPTICS AND PHOTONICS; REFRACTOMETRY; REPRODUCIBILITY OF RESULTS; SEMICONDUCTORS; TEMPERATURE; X-RAY DIFFRACTION;

EID: 67649243471     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.17.011107     Document Type: Article

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